Inventor · disambiguated record
Srikanth Krishnan
Also filed as: KRISHNAN SRIKANTH
25 granted patents·1 pending application·324 citations·filing 1994–2014
96Inventor score
Top patents by PatentIndex Score
26 records- 0189US8138829B2Segmented power amplifier with varying segment activationREDDY VIJAY KUMAR·Filed 2010·Granted Mar 20, 2012·19 cites·16 claims
- 0283US7218132B2System and method for accurate negative bias temperature instability characterizationTEXAS INSTRUMENTS INC·Filed 2005·Granted May 15, 2007·12 cites·12 claims
- 0381US9476933B2Apparatus and methods for qualifying HEMT FET devicesTEXAS INSTRUMENTS INC·Filed 2014·Granted Oct 25, 2016·6 cites·20 claims
- 0477US8219953B2Budgeting electromigration-related reliability among metal paths in the design of a circuitJAIN PALKESH·Filed 2009·Granted Jul 10, 2012·9 cites·2 claims
- 0577US6399445B1Fabrication technique for controlled incorporation of nitrogen in gate dielectricTEXAS INSTRUMENTS INC·Filed 1998·Granted Jun 4, 2002·51 cites·20 claims
- 0675US7212023B2System and method for accurate negative bias temperature instability characterizationTEXAS INSTRUMENTS INC·Filed 2004·Granted May 1, 2007·17 cites·8 claims
- 0771US7808266B2Method and apparatus for evaluating the effects of stress on an RF oscillatorTEXAS INSTRUMENTS INC·Filed 2009·Granted Oct 5, 2010·9 cites·12 claims
- 0870US7974595B2Methodology for assessing degradation due to radio frequency excitation of transistorsTEXAS INSTRUMENTS INC·Filed 2008·Granted Jul 5, 2011·6 cites·17 claims
- 0969US5998299AProtection structures for the suppression of plasma damageTEXAS INSTRUMENTS INC·Filed 1997·Granted Dec 7, 1999·37 cites·25 claims
- 1065US6016062AProcess related damage monitor (predator)--systematic variation of antenna parameters to determine charge damageTEXAS INSTRUMENTS INC·Filed 1996·Granted Jan 18, 2000·35 cites·10 claims
- 1162US5994742APlasma emission triggered protection device for protecting against charge-induced damageTEXAS INSTRUMENTS INC·Filed 1996·Granted Nov 30, 1999·30 cites·6 claims
- 1261US7750400B2Integrated circuit modeling, design, and fabrication based on degradation mechanismsTEXAS INSTRUMENTS INC·Filed 2008·Granted Jul 6, 2010·2 cites·30 claims
- 1356US6396075B1Transient fuse for change-induced damage detectionTEXAS INSTRUMENTS INC·Filed 1999·Granted May 28, 2002·18 cites·11 claims
- 1456US6117745ABistable fuse by amorphization of polysiliconTEXAS INSTRUMENTS INC·Filed 1998·Granted Sep 12, 2000·22 cites·3 claims
- 1556US5596207AApparatus and method for detecting defects in insulative layers of MOS active devicesTEXAS INSTRUMENTS INC·Filed 1994·Granted Jan 21, 1997·22 cites·9 claims
- 1654US6962883B2Integrated circuit insulator and methodTEXAS INSTRUMENTS INC·Filed 2003·Granted Nov 8, 2005·4 cites·4 claims
- 1753US7122466B2Two step semiconductor manufacturing process for copper interconnectsTEXAS INSTRUMENTS INC·Filed 2003·Granted Oct 17, 2006·4 cites·8 claims
- 1851US6586267B2Transient fuse for charge-induced damage detectionTEXAS INSTRUMENTS INC·Filed 2002·Granted Jul 1, 2003·4 cites·9 claims
- 1948US5739052AApparatus and method for detecting defects in insulative layers of MOS active devicesTEXAS INSTRUMENTS INC·Filed 1996·Granted Apr 14, 1998·12 cites·8 claims
- 2047US7638412B2Method and system for reducing charge damage in silicon-on-insulator technologyTEXAS INSTRUMENTS INC·Filed 2007·Granted Dec 29, 2009·0 cites·13 claims
- 2146US7071092B2Method of manufacturing antenna proximity linesTEXAS INSTRUMENTS INC·Filed 2005·Granted Jul 4, 2006·0 cites·7 claims
- 2246US6770937B1Photoconductive thin film for reduction of plasma damageTEXAS INSTRUMENTS INC·Filed 2003·Granted Aug 3, 2004·2 cites·28 claims
- 2344US6969902B2Integrated circuit having antenna proximity lines coupled to the semiconductor substrate contactsTEXAS INSTRUMENTS INC·Filed 2003·Granted Nov 29, 2005·1 cites·7 claims
- 2443US7031163B2Mechanical cooling fin for interconnectsTEXAS INSTRUMENTS INC·Filed 2003·Granted Apr 18, 2006·1 cites·17 claims
- 2541US7262468B2Method and system for reducing charge damage in silicon-on-insulator technologyTEXAS INSTRUMENTS INC·Filed 2001·Granted Aug 28, 2007·1 cites·7 claims
- 2635US2003233624A1Method for predicting the degradation of an integrated circuit performance due to negative bias temperature instabilityTEXAS INSTRUMENTS INC·Filed 2002·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →