Inventor · disambiguated record
Steven D. Draving
Also filed as: DRAVING STEVEN · DRAVING STEVEN D
24 granted patents·3 pending applications·432 citations·filing 1993–2024
96Inventor score
Top patents by PatentIndex Score
27 records- 0195US6175228B1Electronic probe for measuring high impedance tri-state logic circuitsAGILENT TECHNOLOGIES INC·Filed 1998·Granted Jan 16, 2001·150 cites·7 claims
- 0293US11604213B1System and method for reducing error in time domain waveform of a signal under test (SUT)KEYSIGHT TECHNOLOGIES INC·Filed 2020·Granted Mar 14, 2023·4 cites·20 claims
- 0391US11255893B2Measuring error in signal under test (SUT) using multiple channel measurement deviceKEYSIGHT TECHNOLOGIES INC·Filed 2018·Granted Feb 22, 2022·3 cites·20 claims
- 0491US6483284B1Wide-bandwidth probe using pole-zero cancellationAGILENT TECHNOLOGIES INC·Filed 2001·Granted Nov 19, 2002·53 cites·12 claims
- 0588US10200085B1System and method of analyzing crosstalk induced jitterKEYSIGHT TECHNOLOGIES INC·Filed 2016·Granted Feb 5, 2019·8 cites·13 claims
- 0688US6753677B1Trigger jitter reduction for an internally triggered real time digital oscilloscopeAGILENT TECHNOLOGIES INC·Filed 2003·Granted Jun 22, 2004·57 cites·12 claims
- 0781US6898535B2Method and apparatus for decomposing signal jitter using multiple acquisitionsAGILENT TECHNOLOGIES INC·Filed 2003·Granted May 24, 2005·31 cites·42 claims
- 0881US6378757B1Method for edge mounting flex media to a rigid PC boardAGILENT TECHNOLOGIES INC·Filed 2001·Granted Apr 30, 2002·27 cites·9 claims
- 0980US7248982B1Finding data dependent jitter with a DDJ calculator configured by regressionAGILENT TECHNOLOGIES INC·Filed 2006·Granted Jul 24, 2007·10 cites·24 claims
- 1079US6362614B2Electronic probe for measuring high impedance tri-state logic circuitsAGILENT TECHNOLOGIES INC·Filed 2001·Granted Mar 26, 2002·20 cites·16 claims
- 1176US11674993B2Measuring error in signal under test (SUT) using multiple channel measurement deviceKEYSIGHT TECHNOLOGIES INC·Filed 2021·Granted Jun 13, 2023·0 cites·20 claims
- 1275US11536761B2Measuring error in signal under test (SUT) using multiple channel measurement deviceKEYSIGHT TECHNOLOGIES INC·Filed 2021·Granted Dec 27, 2022·0 cites·20 claims
- 1374US10142066B1Jitter analysis systems and methodsKEYSIGHT TECHNOLOGIES INC·Filed 2017·Granted Nov 27, 2018·1 cites·20 claims
- 1471US9673862B1System and method of analyzing crosstalk without measuring aggressor signalKEYSIGHT TECHNOLOGIES INC·Filed 2016·Granted Jun 6, 2017·3 cites·20 claims
- 1566US7251572B1Finding random jitter in an arbitrary non-repeating data signalAGILENT TECHNOLOGIES INC·Filed 2006·Granted Jul 31, 2007·3 cites·8 claims
- 1664US6262602B1Incident-edge detecting probeAGILENT TECHNOLOGIES INC·Filed 1999·Granted Jul 17, 2001·19 cites·8 claims
- 1764US5315627APseudo-random repetitive sampling of a signalHEWLETT PACKARD CO·Filed 1993·Granted May 24, 1994·24 cites·10 claims
- 1861US10033554B1System and method of analyzing crosstalk and intersymbol interference for serial data signalsKEYSIGHT TECHNOLOGIES INC·Filed 2016·Granted Jul 24, 2018·1 cites·20 claims
- 1961US2025362323A1Method and system for phase jitter and phase noise measurements using oscilloscopesKEYSIGHT TECHNOLOGIES INC·Filed 2024·Application pending·0 cites
- 2057US7460591B2Method and apparatus using re-sampled tie records to characterize jitter in a digital signalAGILENT TECHNOLOGIES INC·Filed 2004·Granted Dec 2, 2008·4 cites·15 claims
- 2154US6362635B2Split resistor probe and methodAGILENT TECHNOLOGIES INC·Filed 2001·Granted Mar 26, 2002·6 cites·16 claims
- 2247US7480329B2Method of finding data dependent timing and voltage jitter for different bits in an arbitrary digital signal in accordance with selected surrounding bitsAGILENT TECHNOLOGIES INC·Filed 2004·Granted Jan 20, 2009·0 cites·11 claims
- 2347US7480355B2Method for equalizing a digital signal through removal of data dependent jitterAGILENT TECHNOLOGIES INC·Filed 2005·Granted Jan 20, 2009·0 cites·8 claims
- 2444US8223830B2Method and apparatus for determining equalization coefficientsDRAVING STEVEN D·Filed 2009·Granted Jul 17, 2012·0 cites·18 claims
- 2540US6225816B1Split resistor probe and methodAGILENT TECHNOLOGIES INC·Filed 1999·Granted May 1, 2001·8 cites·3 claims
- 2637US2008056341A1Finding Low Frequency Random and Periodic Jitter in High Speed Digital SignalsDRAVING STEVEN D·Filed 2006·Application pending·0 cites
- 2734US2004183518A1Apparatus and method for clock recovery and eye diagram generationFiled 2003·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →