Inventor · disambiguated record
Steven Farago
Also filed as: FARAGO STEVEN · FARAGO STEVEN R · FARAGO STEVEN ROBERT
13 granted patents·1 pending application·620 citations·filing 1983–2007
93Inventor score
Top patents by PatentIndex Score
14 records- 0195US4972470AProgrammable connectorFARAGO STEVEN·Filed 1987·Granted Nov 20, 1990·320 cites·13 claims
- 0292US4686506AMultiple connector interfaceANICO RESEARCH LTD INC·Filed 1986·Granted Aug 11, 1987·98 cites·13 claims
- 0390US4603320AConnector interfaceANICO RESEARCH LTD INC·Filed 1983·Granted Jul 29, 1986·98 cites·23 claims
- 0477US6785773B2Verification of global coherence in a multi-node NUMA systemIBM·Filed 2001·Granted Aug 31, 2004·33 cites·24 claims
- 0574US7000079B2Method and apparatus for verification of coherence for shared cache components in a system verification environmentIBM·Filed 2003·Granted Feb 14, 2006·27 cites·20 claims
- 0671US7860700B2Hardware verification batch computing farm simulatorIBM·Filed 2007·Granted Dec 28, 2010·7 cites·9 claims
- 0766US6643662B1Split bi-directional stack in a linear memory arrayIBM·Filed 2000·Granted Nov 4, 2003·12 cites·27 claims
- 0855US6629228B1Proportionally growing stack in a linear memory arrayIBM·Filed 2000·Granted Sep 30, 2003·4 cites·15 claims
- 0954US6795878B2Verifying cumulative ordering of memory instructionsIBM·Filed 2000·Granted Sep 21, 2004·4 cites·63 claims
- 1050US7081966B2Demonstration control adjunct device for printersFARAGO STEVEN·Filed 2003·Granted Jul 25, 2006·2 cites·7 claims
- 1145US7454680B2Method, system and computer program product for improving efficiency in generating high-level coverage data for a circuit-testing schemeIBM·Filed 2004·Granted Nov 18, 2008·1 cites·15 claims
- 1243US6934825B1Bi-directional stack in a linear memory arrayIBM·Filed 2000·Granted Aug 23, 2005·5 cites·20 claims
- 1339US2009006066A1Method and System for Automatic Selection of Test CasesBEHM MICHAEL L·Filed 2007·Application pending·0 cites
- 1437US6747752B1Demonstration control adjunct device for printersFiled 1998·Granted Jun 8, 2004·9 cites·2 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →