Inventor · disambiguated record
Stefano Felici
Also filed as: FELICI STEFANO
13 granted patents·5 pending applications·59 citations·filing 2001–2023
88Inventor score
Technology areasG01R
Top patents by PatentIndex Score
18 records- 0191US11867723B2Vertical probe head having an improved contact with a device under testTECHNOPROBE SPA·Filed 2021·Granted Jan 9, 2024·2 cites·10 claims
- 0285US11821918B1Buckling beam probe arrays and methods for making such arrays including forming probes with lateral positions matching guide plate hole positionsMICROFABRICA INC·Filed 2021·Granted Nov 21, 2023·1 cites·19 claims
- 0380US10782319B2Probe card for electronics devicesTECHNOPROBE SPA·Filed 2018·Granted Sep 22, 2020·2 cites·6 claims
- 0479US11029336B2Probe card for high-frequency applicationsTECHNOPROBE SPA·Filed 2019·Granted Jun 8, 2021·2 cites·25 claims
- 0579US6515496B2Microstructure testing headTECHNOPROBE S R L·Filed 2001·Granted Feb 4, 2003·26 cites·35 claims
- 0679US2024019463A1Buckling beam probe arrays and methods for making such arrays including forming probes with lateral positions matching guide plate hole positionsMICROFABRICA INC·Filed 2023·Application pending·0 cites
- 0764US6768327B2Testing head having vertical probes for semiconductor integrated electronic devicesTECHNOPROBE S R L·Filed 2002·Granted Jul 27, 2004·13 cites·48 claims
- 0859US7301354B2Contact probe for a testing head having vertical probes for semiconductor integrated devicesTECHNOPROBE SPA·Filed 2004·Granted Nov 27, 2007·9 cites·42 claims
- 0955US2025334610A1Probe card for a testing apparatus of electronic devices and corresponding space transformerTECHNOPROBE SPA·Filed 2023·Application pending·0 cites
- 1050US11953522B2Probe head for reduced-pitch applicationsTECHNOPROBE SPA·Filed 2020·Granted Apr 9, 2024·0 cites·20 claims
- 1150US11112431B2Probe card for high-frequency applicationsTECHNOPROBE SPA·Filed 2019·Granted Sep 7, 2021·0 cites·23 claims
- 1248US12085588B2Vertical probe head with improved contact properties towards a device under testTECHNOPROBE SPA·Filed 2021·Granted Sep 10, 2024·0 cites·6 claims
- 1348US2024094252A1Shielded Probes for Semiconductor Testing, Methods for Using, and Methods for MakingMICROFABRICA INC·Filed 2021·Application pending·0 cites
- 1446US6674298B2Testing head having cantilever probesTECHNOPROBE S R L·Filed 2001·Granted Jan 6, 2004·4 cites·49 claims
- 1543US2023288447A1Contact probe for a probe headTECHNOPROBE SPA·Filed 2021·Application pending·0 cites
- 1640US9829508B2Testing head of electronic devicesTECHNOPROBE SPA·Filed 2015·Granted Nov 28, 2017·0 cites·24 claims
- 1738US7227368B2Testing head contact probe with an eccentric contact tipTECHNOPROBE SPA·Filed 2005·Granted Jun 5, 2007·0 cites·23 claims
- 1832US2003151419A1Contact probe for a testing headTECHNOPROBE S R L·Filed 2002·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →