Inventor · disambiguated record
Stephen Hensiek
Also filed as: HENSIEK STEPHEN · HENSIEK STEPHEN WAYNE
2 granted patents·1 pending application·49 citations·filing 1999–2001
64Inventor score
Top patents by PatentIndex Score
3 records- 0175US6479386B1Process for reducing surface variations for polished waferMEMC ELECTRONIC MATERIALS·Filed 2000·Granted Nov 12, 2002·22 cites·37 claims
- 0259US6227944B1Method for processing a semiconductor waferMEMC ELECTRONICS MATERIALS INC·Filed 1999·Granted May 8, 2001·27 cites·14 claims
- 0332US2003064902A1Apparatus and process for producing polished semiconductor wafersMEMC ELECTRONIC MATERIALS·Filed 2001·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →