Inventor · disambiguated record
Stanley John
Also filed as: JOHN STANLEY · JOHN STANLEY K
16 granted patents·1 pending application·52 citations·filing 1995–2021
90Inventor score
Top patents by PatentIndex Score
17 records- 0188US8402404B1Stacked die interconnect validationMEHTA ASHOK·Filed 2011·Granted Mar 19, 2013·10 cites·20 claims
- 0283US10256828B2Phase-locked loop monitor circuitTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2017·Granted Apr 9, 2019·3 cites·18 claims
- 0378US9646128B2System and method for validating stacked dies by comparing connectionsTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2015·Granted May 9, 2017·2 cites·20 claims
- 0476US10680627B2Phase-locked loop monitor circuitTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2019·Granted Jun 9, 2020·2 cites·20 claims
- 0575US11025261B2Phase-locked loop monitor circuitTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted Jun 1, 2021·1 cites·17 claims
- 0672US8578309B2Format conversion from value change dump (VCD) to universal verification methodology (UVM)MEHTA ASHOK·Filed 2012·Granted Nov 5, 2013·3 cites·19 claims
- 0770US9612277B2System and method for functional verification of multi-die 3D ICsTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2015·Granted Apr 4, 2017·1 cites·20 claims
- 0866US8079027B2Programming language translation systems and methodsFONG DAVID·Filed 2006·Granted Dec 13, 2011·6 cites·15 claims
- 0964US11411571B2Phase-locked loop monitor circuitTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2021·Granted Aug 9, 2022·0 cites·19 claims
- 1062US5522658AApparatus for mixing lightweight concreteFiled 1995·Granted Jun 4, 1996·24 cites·11 claims
- 1159US11231767B2Dynamic frequency scalingTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2018·Granted Jan 25, 2022·0 cites·20 claims
- 1258US10156609B2Device and method for robustness verificationTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2017·Granted Dec 18, 2018·0 cites·20 claims
- 1354US9047432B2System and method for validating stacked dies by comparing connectionsTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2013·Granted Jun 2, 2015·0 cites·15 claims
- 1447US9633147B1Power state coverage metric and method for estimating the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2015·Granted Apr 25, 2017·0 cites·20 claims
- 1545US8972918B2System and method for functional verification of multi-die 3D ICsJOHN STANLEY·Filed 2012·Granted Mar 3, 2015·0 cites·16 claims
- 1644US2008098366A1Assertion TesterVIA TECH INC·Filed 2006·Application pending·0 cites
- 1743US10061374B2Dynamic frequency scalingTING KAI YUAN·Filed 2012·Granted Aug 28, 2018·0 cites·13 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →