Inventor · disambiguated record

Stefan B. Kaemmer

Also filed as: KAEMMER STEFAN B

2 granted patents·1 pending application·11 citations·filing 2014–2015

56Inventor score

Technology areasG01Q

Files withBRUKER NANO INC3

Top patents by PatentIndex Score

3 records

0190US8881311B2Method and apparatus of physical property measurement using a probe-based nano-localized light sourceBRUKER NANO INC·Filed 2014·Granted Nov 4, 2014·10 cites·20 claims
0266US9052336B2Method and apparatus of physical property measurement using a probe-based nano-localized light sourceBRUKER NANO INC·Filed 2014·Granted Jun 9, 2015·1 cites·12 claims
0355US2016033547A1Method and Apparatus of Physical Property Measurement Using a Probe-Based Nano-Localized Light SourceBRUKER NANO INC·Filed 2015·Application pending·0 cites

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