Inventor · disambiguated record
Stanislaw Piorek
Also filed as: PIOREK STANISLAW
6 granted patents·2 pending applications·91 citations·filing 2008–2018
79Inventor score
Files withRIGAKU ANALYTICAL DEVICES INC3PIOREK STANISLAW2THERMO NITON ANALYZERS LLC2HAMILTON MARK A1
Top patents by PatentIndex Score
8 records- 0194US7916834B2Small spot X-ray fluorescence (XRF) analyzerTHERMO NITON ANALYZERS LLC·Filed 2008·Granted Mar 29, 2011·57 cites·11 claims
- 0291US8515009B1Metal authenticity testing of an object using radiationTHERMO NITON ANALYZERS LLC·Filed 2012·Granted Aug 20, 2013·16 cites·31 claims
- 0388US8982338B2Sample analysisHAMILTON MARK A·Filed 2012·Granted Mar 17, 2015·18 cites·24 claims
- 0448US2011142200A1Small Spot X-Ray Fluorescence (XRF) AnalyzerPIOREK STANISLAW·Filed 2011·Application pending·0 cites
- 0547US10732117B2Device for analyzing the material composition of an object via plasma spectrum analysis having a long pass filterRIGAKU ANALYTICAL DEVICES INC·Filed 2018·Granted Aug 4, 2020·0 cites·19 claims
- 0642US10234396B1Device for analyzing the material composition of a sample via plasma spectrum analysisRIGAKU ANALYTICAL DEVICES INC·Filed 2018·Granted Mar 19, 2019·0 cites·11 claims
- 0739US2013202083A1System and method for identification of counterfeit gold jewelry using xrfPIOREK STANISLAW·Filed 2012·Application pending·0 cites
- 0835US11009397B2Compact two-dimensional spectrometerRIGAKU ANALYTICAL DEVICES INC·Filed 2018·Granted May 18, 2021·0 cites·17 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →