Inventor · disambiguated record
Stephan Schroeder
Also filed as: SCHROEDER STEPHAN · SCHROEDER STEPHAN C
16 granted patents·10 pending applications·136 citations·filing 1998–2012
91Inventor score
Top patents by PatentIndex Score
26 records- 0186US5929338AThickness measurement of in-ground culvertsUS ARMY·Filed 1998·Granted Jul 27, 1999·75 cites·2 claims
- 0274US7877649B2Method and apparatus for testing a memory chip using a common node for multiple inputs and outputsQIMONDA AG·Filed 2007·Granted Jan 25, 2011·10 cites·5 claims
- 0371US7846996B2Polymer concentrates with improved processabilityLANXESS DEUTSCHLAND GMBH·Filed 2006·Granted Dec 7, 2010·2 cites·3 claims
- 0468US7206238B2Integrated semiconductor memory comprising at least one word line and methodINFINEON TECHNOLOGIES AG·Filed 2005·Granted Apr 17, 2007·7 cites·16 claims
- 0566US9937009B2Torque-limiting assembly for a surgical powertoolSCHROEDER STEPHAN·Filed 2012·Granted Apr 10, 2018·8 cites·17 claims
- 0666US6914837B2DRAM memory with a shared sense amplifier structureINFINEON TECHNOLOGIES AG·Filed 2004·Granted Jul 5, 2005·15 cites·20 claims
- 0750US6639861B2Integrated memory and method for testing an integrated memoryINFINEON TECHNOLOGIES AG·Filed 2002·Granted Oct 28, 2003·7 cites·7 claims
- 0849US6906972B2Integrated DRAM semiconductor memory and method for operating the sameINFINEON TECHNOLOGIES AG·Filed 2003·Granted Jun 14, 2005·6 cites·14 claims
- 0947US2011040008A1Polymer concentrates with improved processabilityPASK STEPHEN·Filed 2010·Application pending·0 cites
- 1046US7512023B2Memory and method for improving the reliability of a memory having a used memory region and an unused memory regionQIMONDA AG·Filed 2006·Granted Mar 31, 2009·1 cites·10 claims
- 1139US7110310B2RAM store and control method thereforINFINEON TECHNOLOGIES AG·Filed 2004·Granted Sep 19, 2006·2 cites·17 claims
- 1239US2006192085A1Semiconductor circuit and arrangement and method for monitoring fuses of a semiconductor circuitEGGERS GEORG E·Filed 2006·Application pending·0 cites
- 1338US7752510B2Integrated device for simplified parallel testing, test board for testing a plurality of integrated devices, and test system and tester unitQIMONDA AG·Filed 2007·Granted Jul 6, 2010·0 cites·5 claims
- 1438US7402859B2Field effect semiconductor switch and method for fabricating itINFINEON TECHNOLOGIES AG·Filed 2005·Granted Jul 22, 2008·0 cites·23 claims
- 1538US6970389B2Integrated memoryINFINEON TECHNOLOGIES AG·Filed 2004·Granted Nov 29, 2005·2 cites·4 claims
- 1637US7710810B2Device for refreshing memory contentsQIMONDA AG·Filed 2007·Granted May 4, 2010·0 cites·27 claims
- 1736US6965535B2Integrated semiconductor memory circuit and a method for operating the sameINFINEON TECHNOLOGIES AG·Filed 2003·Granted Nov 15, 2005·1 cites·16 claims
- 1835US2008219060A1Device and method for internal voltage monitoringQIMONDA AG·Filed 2007·Application pending·0 cites
- 1934US2007253264A1Integrated Semiconductor Memory with a Test Function and Method for Testing an Integrated Semiconductor MemoryPROELL MANFRED·Filed 2007·Application pending·0 cites
- 2033US2005280036A1Semiconductor product having a first and at least one further semiconductor circuit and methodSCHROEDER STEPHAN·Filed 2005·Application pending·0 cites
- 2133US2007258307A1Memory circuit and method for refreshing dynamic memory cellsPROELL MANFRED·Filed 2007·Application pending·0 cites
- 2233US2007260955A1Test auxiliary device in a memory moduleKLIEWER JOERG·Filed 2007·Application pending·0 cites
- 2333US2007070758A1Semiconductor memory with sense amplifier and switchQIMONDA AG·Filed 2006·Application pending·0 cites
- 2433US2007047355A1Method for detecting a leakage current of a semiconductor memoryQIMONDA AG·Filed 2006·Application pending·0 cites
- 2532US7248536B2Integrated semiconductor memory and method for operating an integrated semiconductor memoryINFINEON TECHNOLOGIES AG·Filed 2005·Granted Jul 24, 2007·0 cites·25 claims
- 2631US2006056241A1Artificial aging of chips with memoriesAUGE JUERGEN·Filed 2005·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →