Inventor · disambiguated record

Steve Scranton

Also filed as: SCRANTON STEVE

2 granted patents·7 citations·filing 2018–2019

53Inventor score

Technology areasH10P

Files withNANOTRONICS IMAGING INC2

Top patents by PatentIndex Score

2 records

0186US10254214B1Systems, devices, and methods for combined wafer and photomask inspectionNANOTRONICS IMAGING INC·Filed 2018·Granted Apr 9, 2019·6 cites·12 claims
0270US11125677B2Systems, devices, and methods for combined wafer and photomask inspectionNANOTRONICS IMAGING INC·Filed 2019·Granted Sep 21, 2021·1 cites·12 claims

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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →