Inventor · disambiguated record
Steven C. Steps
Also filed as: STEPS STEVEN C
25 granted patents·4 pending applications·170 citations·filing 1983–2024
95Inventor score
Top patents by PatentIndex Score
29 records- 0197US12007451B2Method and system for thermal control of devices in an electronics testerAEHR TEST SYSTEMS·Filed 2021·Granted Jun 11, 2024·2 cites·15 claims
- 0296US12292484B2Method and system for thermal control of devices in an electronics testerAEHR TEST SYSTEMS·Filed 2024·Granted May 6, 2025·1 cites·20 claims
- 0394US7667475B2Electronics tester with a signal distribution board and a wafer chuck having different coefficients of thermal expansionAEHR TEST SYSTEMS·Filed 2008·Granted Feb 23, 2010·16 cites·87 claims
- 0491US2025093398A1Electronics testerAEHR TEST SYSTEMS·Filed 2024·Application pending·0 cites
- 0591US2025093399A1Electronics testerAEHR TEST SYSTEMS·Filed 2024·Application pending·0 cites
- 0690US12265136B2Method and system for thermal control of devices in electronics testerAEHR TEST SYSTEMS·Filed 2024·Granted Apr 1, 2025·0 cites·9 claims
- 0788US12169217B2Electronics testerAEHR TEST SYSTEMS·Filed 2023·Granted Dec 17, 2024·0 cites·10 claims
- 0888US2024302451A1Method and system for thermal control of devices in an electronics testerAEHR TEST SYSTEMS·Filed 2024·Application pending·0 cites
- 0985US11821940B2Electronics testerAEHR TEST SYSTEMS·Filed 2023·Granted Nov 21, 2023·0 cites·9 claims
- 1080US11635459B2Electronics testerAEHR TEST SYSTEMS·Filed 2021·Granted Apr 25, 2023·0 cites·9 claims
- 1180US10649022B2Electronics testerAEHR TEST SYSTEMS·Filed 2018·Granted May 12, 2020·1 cites·13 claims
- 1279US9291668B2Electronics tester with a valve integrally formed in a component of a portable packAEHR TEST SYSTEMS·Filed 2015·Granted Mar 22, 2016·1 cites·29 claims
- 1376US10466292B2Method and system for thermal control of devices in an electronics testerAEHR TEST SYSTEMS·Filed 2017·Granted Nov 5, 2019·1 cites·19 claims
- 1475US10976362B2Electronics tester with power saving stateAEHR TEST SYSTEMS·Filed 2020·Granted Apr 13, 2021·0 cites·11 claims
- 1574US11199572B2Electronics testerAEHR TEST SYSTEMS·Filed 2020·Granted Dec 14, 2021·0 cites·14 claims
- 1674US4724518AOdd/even storage in cache memoryHEWLETT PACKARD CO·Filed 1987·Granted Feb 9, 1988·50 cites·10 claims
- 1774US4654787AApparatus for locating memory modules having different sizes within a memory spaceHEWLETT PACKARD CO·Filed 1983·Granted Mar 31, 1987·45 cites·6 claims
- 1873US4858111AWrite-back cache system using concurrent address transfers to setup requested address in main memory before dirty miss signal from cacheHEWLETT PACKARD CO·Filed 1986·Granted Aug 15, 1989·49 cites·8 claims
- 1972US10718808B2Electronics tester with current amplificationAEHR TEST SYSTEMS·Filed 2018·Granted Jul 21, 2020·0 cites·9 claims
- 2069US10151793B2Electronics tester with double-spiral thermal control passage in a thermal chuckAEHR TEST SYSTEMS·Filed 2017·Granted Dec 11, 2018·0 cites·76 claims
- 2167US11209497B2Method and system for thermal control of devices in an electronics testerAEHR TEST SYSTEMS·Filed 2019·Granted Dec 28, 2021·0 cites·29 claims
- 2267US9857418B2Electronics tester with group and individual current configurationsAEHR TEST SYSTEMS·Filed 2016·Granted Jan 2, 2018·0 cites·9 claims
- 2365US9500702B2Electronics tester with hot fluid thermal controlAEHR TEST SYSTEMS·Filed 2016·Granted Nov 22, 2016·0 cites·13 claims
- 2464US2025093400A1Electronics testerAEHR TEST SYSTEMS·Filed 2024·Application pending·0 cites
- 2555US9086449B2Adhesively attached stand-offs on a portable pack for an electronics testerSTEPS STEVEN C·Filed 2012·Granted Jul 21, 2015·0 cites·87 claims
- 2655US7902846B2Electronics tester with a signal distribution board and a wafer chuck having different coefficients of thermal expansionAEHR TEST SYSTEMS·Filed 2010·Granted Mar 8, 2011·0 cites·93 claims
- 2753US8198909B2Electronics tester with a signal distribution board and a wafer chuck having different coefficients of thermal expansionSTEPS STEVEN C·Filed 2011·Granted Jun 12, 2012·0 cites·9 claims
- 2852USD850309SLayout of contactsAEHR TEST SYSTEMS·Filed 2017·Granted Jun 4, 2019·4 cites·1 claims
- 2933USD875579SLayout of contactsAEHR TEST SYSTEMS·Filed 2019·Granted Feb 18, 2020·0 cites·1 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →