Inventor · disambiguated record
Stephan Weiß
Also filed as: WEISS STEPHAN
1 granted patent·5 pending applications·1 citations·filing 2022–2025
17Inventor score
Files withPRECITEC OPTRONIK GMBH6
Top patents by PatentIndex Score
6 records- 0183US12264914B2Device and method for measuring wafersPRECITEC OPTRONIK GMBH·Filed 2024·Granted Apr 1, 2025·1 cites·14 claims
- 0265US2025198743A1Device and method for measuring wafersPRECITEC OPTRONIK GMBH·Filed 2025·Application pending·0 cites
- 0363US2025189299A1Device and Method for Measuring WafersPRECITEC OPTRONIK GMBH·Filed 2023·Application pending·0 cites
- 0453US2024393261A1Apparatus and method for measuring wafersPRECITEC OPTRONIK GMBH·Filed 2024·Application pending·0 cites
- 0547US2024377186A1Method and device for measuring optical thicknessPRECITEC OPTRONIK GMBH·Filed 2022·Application pending·0 cites
- 0646US2024167808A1Chromatic confocal measuring system for high-speed distance measurementPRECITEC OPTRONIK GMBH·Filed 2022·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →