Inventor · disambiguated record
Sundar Chetlur
Also filed as: CHETLUR SUNDAR · CHETLUR SUNDAR S · CHETLUR SUNDAR SRINIVASAAN
32 granted patents·2 pending applications·123 citations·filing 2000–2024
96Inventor score
Files withALLEGRO MICROSYSTEMS LLC29AGERE SYST GUARDIAN CORP3AGERE SYSTEMS INC1TELEFUNKEN Semiconductors AMERICA LLC1
Top patents by PatentIndex Score
34 records- 0197US11630169B1Fabricating a coil above and below a magnetoresistance elementALLEGRO MICROSYSTEMS LLC·Filed 2022·Granted Apr 18, 2023·4 cites·22 claims
- 0297US11005036B2Magnetoresistance structure including two hard masksALLEGRO MICROSYSTEMS LLC·Filed 2020·Granted May 11, 2021·5 cites·20 claims
- 0396US10352969B2Systems and methods for integrated shielding in a current sensorALLEGRO MICROSYSTEMS LLC·Filed 2016·Granted Jul 16, 2019·14 cites·19 claims
- 0495US11782105B2Fabricating planarized coil layer in contact with magnetoresistance elementALLEGRO MICROSYSTEMS LLC·Filed 2022·Granted Oct 10, 2023·3 cites·28 claims
- 0593US11515246B2Dual circuit digital isolatorALLEGRO MICROSYSTEMS LLC·Filed 2020·Granted Nov 29, 2022·3 cites·13 claims
- 0693US10566526B1Patterning of a magnetoresistance structure including two hard masksALLEGRO MICROSYSTEMS LLC·Filed 2018·Granted Feb 18, 2020·9 cites·13 claims
- 0790US11262385B2Systems and methods for integrated shielding in a current sensorALLEGRO MICROSYSTEMS LLC·Filed 2019·Granted Mar 1, 2022·4 cites·24 claims
- 0890US10916438B2Method of multiple gate oxide forming with hard maskALLEGRO MICROSYSTEMS LLC·Filed 2019·Granted Feb 9, 2021·8 cites·14 claims
- 0990US10868240B2Electronic circuit structure and method of fabricating electronic circuit structure having magnetoresistance element with improved electrical contactsALLEGRO MICROSYSTEMS LLC·Filed 2019·Granted Dec 15, 2020·6 cites·17 claims
- 1089US12000870B2Multi-terminal devices using magnetoresistance elementsALLEGRO MICROSYSTEMS LLC·Filed 2022·Granted Jun 4, 2024·1 cites·25 claims
- 1188US10468485B2Metal-oxide semiconductor (MOS) device structure based on a poly-filled trench isolation regionALLEGRO MICROSYSTEMS LLC·Filed 2017·Granted Nov 5, 2019·5 cites·48 claims
- 1285US2025067778A1Systems and Methods for Integrated Shielding in a Current SensorALLEGRO MICROSYSTEMS LLC·Filed 2024·Application pending·0 cites
- 1384US12249646B2Double-diffused metal-oxide-semiconductor transistor including a recessed dielectricALLEGRO MICROSYSTEMS LLC·Filed 2022·Granted Mar 11, 2025·1 cites·10 claims
- 1484US10622549B2Signal isolator having interposerALLEGRO MICROSYSTEMS LLC·Filed 2017·Granted Apr 14, 2020·2 cites·30 claims
- 1582US11195826B2Electrostatic discharge protectionALLEGRO MICROSYSTEMS LLC·Filed 2020·Granted Dec 7, 2021·2 cites·20 claims
- 1679US6391668B1Method of determining a trap density of a semiconductor/oxide interface by a contactless charge techniqueAGERE SYST GUARDIAN CORP·Filed 2000·Granted May 21, 2002·27 cites·33 claims
- 1776US11170858B2Method and apparatus for eliminating EEPROM bit-disturbALLEGRO MICROSYSTEMS LLC·Filed 2020·Granted Nov 9, 2021·1 cites·20 claims
- 1875US12210040B2Systems and methods for integrated shielding in a current sensorALLEGRO MICROSYSTEMS LLC·Filed 2022·Granted Jan 28, 2025·0 cites·18 claims
- 1973US10943976B2Metal-oxide semiconductor (MOS) device structure based on a poly-filled trench isolation regionALLEGRO MICROSYSTEMS LLC·Filed 2019·Granted Mar 9, 2021·1 cites·20 claims
- 2072US11327882B2Method and apparatus for eliminating bit disturbance errors in non-volatile memory devicesALLEGRO MICROSYSTEMS LLC·Filed 2020·Granted May 10, 2022·1 cites·24 claims
- 2171US12068237B2Dual circuit digital isolatorALLEGRO MICROSYSTEMS LLC·Filed 2022·Granted Aug 20, 2024·0 cites·20 claims
- 2271US11598830B1TMR assembly having a heat sinkALLEGRO MICROSYSTEMS LLC·Filed 2022·Granted Mar 7, 2023·0 cites·16 claims
- 2370US6439972B2Polishing fluid, polishing method, semiconductor device and semiconductor device fabrication methodAGERE SYST GUARDIAN CORP·Filed 2001·Granted Aug 27, 2002·5 cites·20 claims
- 2467US12310246B2Fabricating an electroconductive contact on a top surface of a tunneling magnetoresistance elementALLEGRO MICROSYSTEMS LLC·Filed 2022·Granted May 20, 2025·0 cites·20 claims
- 2565US11719771B1Magnetoresistive sensor having seed layer hysteresis suppressionALLEGRO MICROSYSTEMS LLC·Filed 2022·Granted Aug 8, 2023·0 cites·23 claims
- 2665US9230861B2Method of forming a backside contact structure having selective side-wall isolationTELEFUNKEN Semiconductors AMERICA LLC·Filed 2013·Granted Jan 5, 2016·5 cites·18 claims
- 2761US2021057642A1Electronic circuit structure and method of fabricating electronic circuit structure having magnetoresistance element with improved electrical contactsALLEGRO MICROSYSTEMS LLC·Filed 2020·Application pending·0 cites
- 2860US6693434B2Automated system for estimating ring oscillator reliability and testing AC response and method of operation thereofAGERE SYSTEMS INC·Filed 2001·Granted Feb 17, 2004·11 cites·19 claims
- 2955US6328633B1Polishing fluid, polishing method, semiconductor device and semiconductor device fabrication methodAGERE SYST GUARDIAN CORP·Filed 2000·Granted Dec 11, 2001·5 cites·5 claims
- 3052US12364163B2Fabricating an electroconductive contact on a top layer of a tunneling magnetoresistance element using two hard masksALLEGRO MICROSYSTEMS LLC·Filed 2022·Granted Jul 15, 2025·0 cites·10 claims
- 3151US12484258B2Flash memory cell structure having separate program and erase electron pathsALLEGRO MICROSYSTEMS LLC·Filed 2022·Granted Nov 25, 2025·0 cites·29 claims
- 3251US11967650B2Snapback electrostatic discharge protection device with tunable parametersALLEGRO MICROSYSTEMS LLC·Filed 2022·Granted Apr 23, 2024·0 cites·17 claims
- 3348US11303116B2Methods and apparatus for electrical overstress protectionALLEGRO MICROSYSTEMS LLC·Filed 2018·Granted Apr 12, 2022·0 cites·12 claims
- 3443US11367830B2Multi-layer integrated circuit with enhanced thermal dissipation using back-end metal layersALLEGRO MICROSYSTEMS LLC·Filed 2020·Granted Jun 21, 2022·0 cites·45 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →