Inventor · disambiguated record
Susumu Hirano
Also filed as: HIRANO SUSUMU
7 granted patents·3 pending applications·126 citations·filing 1989–2025
85Inventor score
Files withMITSUBISHI ELECTRIC CORP4DORYOKURO KAKUNENRYO2SUMITOMO METAL IND2ANZAI SOGO KENKYUSHO KK1MITSUBISHI RAYON CO1
Top patents by PatentIndex Score
10 records- 0189US4960562ADispersion strengthened ferritic steel cladding tube for nuclear reactor and its production methodDORYOKURO KAKUNENRYO·Filed 1989·Granted Oct 2, 1990·30 cites·14 claims
- 0288US6878219B2High strength steel pipe for an air bag and a process for its manufactureSUMITOMO METAL IND·Filed 2002·Granted Apr 12, 2005·21 cites·16 claims
- 0380US4963200ADispersion strengthened ferritic steel for high temperature structural useDORYOKURO KAKUNENRYO·Filed 1989·Granted Oct 16, 1990·45 cites·4 claims
- 0457US2025217564A1Circuit quality confirmation apparatus and circuit quality confirmation methodMITSUBISHI ELECTRIC CORP·Filed 2025·Application pending·0 cites
- 0554US11550978B2Circuit design assistance system and computer readable mediumMITSUBISHI ELECTRIC CORP·Filed 2021·Granted Jan 10, 2023·0 cites·3 claims
- 0653US5362795AProcess for producing rubber-containing graft copolymer particlesMITSUBISHI RAYON CO·Filed 1993·Granted Nov 8, 1994·12 cites·8 claims
- 0751US7846274B2High strength steel pipe for an air bagSUMITOMO METAL IND·Filed 2004·Granted Dec 7, 2010·0 cites·4 claims
- 0848US5190163ASorting apparatus utilizing transmitted lightANZAI SOGO KENKYUSHO KK·Filed 1992·Granted Mar 2, 1993·18 cites·12 claims
- 0936US2016004797A1Circuit designing support apparatus and programMITSUBISHI ELECTRIC CORP·Filed 2015·Application pending·0 cites
- 1035US2004019830A1Test apparatus of semiconductor integrated circuit with hold error preventing functionMITSUBISHI ELECTRIC CORP·Filed 2003·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when Susumu Hirano files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →