Inventor · disambiguated record

Sungkyu Kwon

Also filed as: KWON SUNGKYU

1 granted patent·1 citations·filing 2018–2018

16Inventor score

Technology areasH10P

Files withIAC IN NAT UNIV CHUNGNAM1

Top patents by PatentIndex Score

1 record

0159US11088138B2Semiconductor device for testing characteristics of transistors and method for testing semiconductor deviceIAC IN NAT UNIV CHUNGNAM·Filed 2018·Granted Aug 10, 2021·1 cites·7 claims

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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →