Inventor · disambiguated record
Susanne Lachenmann
Also filed as: LACHENMANN SUSANNE
4 granted patents·2 pending applications·14 citations·filing 2003–2006
69Inventor score
Technology areasH10P
Top patents by PatentIndex Score
6 records- 0173US7372072B2Semiconductor wafer with test structureINFINEON TECHNOLOGIES AG·Filed 2005·Granted May 13, 2008·8 cites·20 claims
- 0256US7205567B2Semiconductor product having a semiconductor substrate and a test structure and methodINFINEON TECHNOLOGIES AG·Filed 2006·Granted Apr 17, 2007·1 cites·24 claims
- 0347US6856562B2Test structure for measuring a junction resistance in a DRAM memory cell arrayINFINEON TECHNOLOGIES AG·Filed 2003·Granted Feb 15, 2005·3 cites·6 claims
- 0440US7126154B2Test structure for a single-sided buried strap DRAM memory cell arrayINFINEON TECHNOLOGIES AG·Filed 2004·Granted Oct 24, 2006·2 cites·5 claims
- 0532US2006157702A1Kerf with improved fill routineINFINEON TECHNOLOGIES AG·Filed 2006·Application pending·0 cites
- 0630US2006138411A1Semiconductor wafer with a test structure, and methodLACHENMANN SUSANNE·Filed 2005·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →