Inventor · disambiguated record
Sungcheol Park
Also filed as: PARK SUNGCHEOL
4 granted patents·10 pending applications·32 citations·filing 2011–2025
65Inventor score
Top patents by PatentIndex Score
14 records- 0190US9070185B2Noise filtering method and apparatus considering noise variance and motion detectionLEE SANGHOON·Filed 2011·Granted Jun 30, 2015·32 cites·11 claims
- 0271US12455317B2Logic BIST circuit and semiconductor device including sameSAMSUNG ELECTRONICS CO LTD·Filed 2024·Granted Oct 28, 2025·0 cites·18 claims
- 0356US2025258217A1Integrated circuit and test system including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 0453US2025284870A1Method and system for designing integrated circuitsSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 0552US2025103787A1Routing method and systemSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 0652US2025199909A1Memory system supporting multi-channel interfaceSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 0751US2025103488A1Memory device, cxl memory device, system in package, and system on chip including high bandwidth memorySAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 0851US2025266823A1System-on-chip for power management in multi-die structureSAMSUNG ELECTRONICS CO LTD·Filed 2025·Application pending·0 cites
- 0950US11698659B2Integrated circuit and operating method thereofSAMSUNG ELECTRONICS CO LTD·Filed 2021·Granted Jul 11, 2023·0 cites·20 claims
- 1049US2025321827A1Semiconductor device and method of repairing the sameSAMSUNG ELECTRONICS CO LTD·Filed 2025·Application pending·0 cites
- 1149US2025370032A1Semiconductor system that dynamically adjusts operating voltageSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 1248US2025174263A1Memory device performing refresh operation and operation method thereofSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 1347US2025363018A1Memory system and repair operation method thereofSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 1444US12442858B2Semiconductor integrated circuit, a method for testing the semiconductor integrated circuit, and a semiconductor systemSAMSUNG ELECTRONICS CO LTD·Filed 2022·Granted Oct 14, 2025·0 cites·15 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →