Inventor · disambiguated record
Sung-Hong Park
Also filed as: PARK SUNG HONG
9 granted patents·3 pending applications·7 citations·filing 2006–2025
77Inventor score
Files withKOREA ADVANCED INST SCI & TECH5SAMSUNG ELECTRONICS CO LTD5KOREA ASTRONOMY & SPACE SCIENCE INST1PARK SUNG-HONG1
Top patents by PatentIndex Score
12 records- 0169US7747063B2Method and apparatus for inspecting a substrateSAMSUNG ELECTRONICS CO LTD·Filed 2006·Granted Jun 29, 2010·4 cites·10 claims
- 0264US2025389855A1Solar irradiance prediction system and method for soft x-rays and euv wavelength rangesKOREA ASTRONOMY & SPACE SCIENCE INST·Filed 2025·Application pending·0 cites
- 0362US10136834B2Neuronal resonance magnetic resonance imaging methodKOREA ADVANCED INST SCI & TECH·Filed 2014·Granted Nov 27, 2018·1 cites·14 claims
- 0455US8676296B2Echo-specific K-space reordering approach to compatible dual-echo arteriovenographyPARK SUNG-HONG·Filed 2009·Granted Mar 18, 2014·2 cites·7 claims
- 0549US11573283B1Single-shot pseudo-centric epi method for magnetization-prepared imagingKOREA ADVANCED INST SCI & TECH·Filed 2021·Granted Feb 7, 2023·0 cites·13 claims
- 0648US11029381B2Method for varying undersampling dimension for accelerating multiple-acquisition magnetic resonance imaging and device for the sameKOREA ADVANCED INST SCI & TECH·Filed 2019·Granted Jun 8, 2021·0 cites·9 claims
- 0746US11185248B2MRI approach of multiple times to repeat for detection of neuronal oscillationsKOREA ADVANCED INST SCI & TECH·Filed 2018·Granted Nov 30, 2021·0 cites·14 claims
- 0846US2025372433A1Wafer transfer device and wafer transfer systemSAMSUNG ELECTRONICS CO LTD·Filed 2025·Application pending·0 cites
- 0942US7626164B2Method of scanning a substrate, and method and apparatus for analyzing crystal characteristicsSAMSUNG ELECTRONICS CO LTD·Filed 2006·Granted Dec 1, 2009·0 cites·19 claims
- 1040US7498248B2Methods of compensating for an alignment error during fabrication of structures on semiconductor substratesSAMSUNG ELECTRONICS CO LTD·Filed 2006·Granted Mar 3, 2009·0 cites·15 claims
- 1140US2007030479A1Method of inspecting a defect on a substrateSAMSUNG ELECTRONICS CO LTD·Filed 2006·Application pending·0 cites
- 1238US11209512B2Method for acquiring variable slab magnetic resonance imaging dataKOREA ADVANCED INST SCI & TECH·Filed 2017·Granted Dec 28, 2021·0 cites·16 claims
Join the waitlist — get patent alerts
Get an alert when Sung-Hong Park files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →