Inventor · disambiguated record
Sung Yoon Ryu
Also filed as: RYU SUNG YOON
18 granted patents·16 pending applications·21 citations·filing 2011–2024
89Inventor score
Top patents by PatentIndex Score
34 records- 0187US10001444B2Surface inspecting methodSAMSUNG ELECTRONICS CO LTD·Filed 2015·Granted Jun 19, 2018·4 cites·19 claims
- 0287US9733178B2Spectral ellipsometry measurement and data analysis device and related systems and methodsSAMSUNG ELECTRONICS CO LTD·Filed 2015·Granted Aug 15, 2017·3 cites·16 claims
- 0383US9831626B2Broadband light source and optical inspector having the sameSAMSUNG ELECTRONICS CO LTD·Filed 2015·Granted Nov 28, 2017·2 cites·17 claims
- 0481US11043433B2Method of inspecting surface and method of manufacturing semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2020·Granted Jun 22, 2021·1 cites·26 claims
- 0581US10249544B2Method of inspecting surface and method of manufacturing semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2017·Granted Apr 2, 2019·2 cites·20 claims
- 0673US10593032B2Defect inspection method and defect inspection apparatusSAMSUNG ELECTRONICS CO LTD·Filed 2017·Granted Mar 17, 2020·1 cites·18 claims
- 0770US10551326B2Method for measuring semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2017·Granted Feb 4, 2020·2 cites·16 claims
- 0870US9583402B2Method of manufacturing a semiconductor device using semiconductor measurement systemSAMSUNG ELECTRONICS CO LTD·Filed 2015·Granted Feb 28, 2017·2 cites·19 claims
- 0970US8817364B2Device which produces various types of pulses by controlling the distance between the saturable absorber connectorsKOREA ADVANCED INST SCI & TECH·Filed 2013·Granted Aug 26, 2014·3 cites·4 claims
- 1068US11004712B2Method of inspecting semiconductor wafer, inspection system for performing the same, and method of fabricating semiconductor device using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2019·Granted May 11, 2021·1 cites·20 claims
- 1162US2025218041A1Method and apparatus with scanning electron microscope image correctionSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 1260US2024355666A1Substrate transferring apparatusSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 1357US2019214316A1Method of inspecting surface and method of manufacturing semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2019·Application pending·0 cites
- 1456US2021026152A1Multilayer structure inspection apparatus and method, and semiconductor device fabricating method using the inspection methodSAMSUNG ELECTRONICS CO LTD·Filed 2020·Application pending·0 cites
- 1554US2023367079A1Light source uniformity adjusting device, optical device including the same, and light source uniformity adjusting methodSAMSUNG ELECTRONICS CO LTD·Filed 2023·Application pending·0 cites
- 1651US10585115B2Scanning probe inspectorSAMSUNG ELECTRONICS CO LTD·Filed 2018·Granted Mar 10, 2020·0 cites·18 claims
- 1750US12332186B2Method and system for inspecting semiconductor wafer and method of fabricating semiconductor device using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2022·Granted Jun 17, 2025·0 cites·20 claims
- 1850US2025167051A1Electronic device for predicting characteristic of semiconductor device and operating method of electronic deviceSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 1949US2023366853A1Semiconductor device testing apparatus and methods of testing and fabricating semiconductor device using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2023·Application pending·0 cites
- 2049US2019137776A1Methods of manufacturing vertical semiconductor devicesSAMSUNG ELECTRONICS CO LTD·Filed 2018·Application pending·0 cites
- 2148US10845232B2Mass flow controller, apparatus for manufacturing semiconductor device, and method for maintenance thereofSAMSUNG ELECTRONICS CO LTD·Filed 2018·Granted Nov 24, 2020·0 cites·20 claims
- 2245US9417055B2Apparatus for measuring thickness of thin film, system including the apparatus, and method for measuring thickness of thin filmSAMSUNG ELECTRONICS CO LTD·Filed 2015·Granted Aug 16, 2016·0 cites·20 claims
- 2345US2020182783A1Measuring apparatus and substrate analysis method using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2019·Application pending·0 cites
- 2440US10269111B2Method of inspecting semiconductor wafer, an inspection system for performing the same, and a method of fabricating semiconductor device using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2017·Granted Apr 23, 2019·0 cites·19 claims
- 2540US8709184B2Single walled carbon nanotube saturable absorber production via multi-vacuum filtration methodKOREA ADVANCED INST SCI & TECH·Filed 2013·Granted Apr 29, 2014·0 cites·6 claims
- 2639US11494642B2Thickness prediction network learning method, semiconductor device manufacturing method, and semiconductor material deposition equipmentSAMSUNG ELECTRONICS CO LTD·Filed 2019·Granted Nov 8, 2022·0 cites·2 claims
- 2739US2019130552A1Methods of inspecting defect and methods of fabricating a semiconductor device using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2018·Application pending·0 cites
- 2839US2019139796A1Monitoring apparatus and semiconductor manufacturing apparatus including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2018·Application pending·0 cites
- 2939US2019114755A1Semiconductor chip inspection deviceSAMSUNG ELECTRONICS CO LTD·Filed 2018·Application pending·0 cites
- 3037US2012161033A1Microorganism detection apparatusKWON JOONHYUNG·Filed 2011·Application pending·0 cites
- 3137US2012162644A1Microparticle detection apparatusKWON JOONHYUNG·Filed 2011·Application pending·0 cites
- 3236US10088297B2Apparatus and method for measuring thicknessSAMSUNG ELECTRONICS CO LTD·Filed 2017·Granted Oct 2, 2018·0 cites·10 claims
- 3335US2013287051A1Apparatus and method for stabilizing pulse of fiber-type femtosecond laserKOREA ADVANCED INST SCI & TECH·Filed 2013·Application pending·0 cites
- 3434US2017200658A1Methods of inspecting substrates and semiconductor fabrication methods incorporating the sameSAMSUNG ELECTRONICS CO LTD·Filed 2016·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when Sung Yoon Ryu files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →