Inventor · disambiguated record
Sungyoon Ryu
Also filed as: RYU SUNGYOON
7 granted patents·7 pending applications·1 citations·filing 2009–2025
70Inventor score
Top patents by PatentIndex Score
14 records- 0179US11988495B2Through-focus image-based metrology device, operation method thereof, and computing device for executing the operationSAMSUNG ELECTRONICS CO LTD·Filed 2021·Granted May 21, 2024·1 cites·16 claims
- 0275US2024385220A1Test apparatus and test method thereofRYU SUNGYOON·Filed 2024·Application pending·0 cites
- 0375US2025341540A1Method of inspecting tip of atomic force microscope and method of manufacturing semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2025·Application pending·0 cites
- 0471US12474260B2Terahertz signal measuring apparatus and measuring methodSAMSUNG ELECTRONICS CO LTD·Filed 2023·Granted Nov 18, 2025·0 cites·20 claims
- 0569US12385946B2Method of inspecting tip of atomic force microscope and method of manufacturing semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2022·Granted Aug 12, 2025·0 cites·8 claims
- 0668US12092656B2Test apparatus and test method thereofSAMSUNG ELECTRONICS CO LTD·Filed 2022·Granted Sep 17, 2024·0 cites·20 claims
- 0761US2025003734A1Material measurement system and methodSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 0860US2025216348A1X-ray photoelectron spectroscopy apparatus and method for calculating concentration of specific element in object under inspection using x-ray photoelectron spectroscopySAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 0952US2024255439A1Defect detection device and defect detection methodSAMSUNG ELECTRONICS CO LTD·Filed 2023·Application pending·0 cites
- 1049US11921270B2Inspection system including reference specimen and method of forming semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2021·Granted Mar 5, 2024·0 cites·20 claims
- 1148US2023384212A1Inspection method and method of manufacturing semiconductor memory device using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2023·Application pending·0 cites
- 1246US2021140899A1Substrate inspection deviceSAMSUNG ELECTRONICS CO LTD·Filed 2020·Application pending·0 cites
- 1337US11428645B2Wafer inspection device and method of manufacturing semiconductor device by using the wafer inspection deviceSAMSUNG ELECTRONICS CO LTD·Filed 2020·Granted Aug 30, 2022·0 cites·20 claims
- 1431US8237925B2Prism for inducing Brewster's angle transmission and fluorescence detection apparatus for improving signal-to noise ratio using thereofHONG YOUNGJOO·Filed 2009·Granted Aug 7, 2012·0 cites·12 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →