Inventor · disambiguated record
Susan E. Skrabanek
Also filed as: SKRABANEK SUSAN E · SKRABANEK SUSAN EILEEN
21 granted patents·3 pending applications·307 citations·filing 2001–2016
96Inventor score
Top patents by PatentIndex Score
24 records- 0194US8495583B2System and method to determine defect risks in software solutionsBASSIN KATHRYN A·Filed 2009·Granted Jul 23, 2013·41 cites·24 claims
- 0293US8578341B2System and method to map defect reduction data to organizational maturity profiles for defect projection modelingBASSIN KATHRYN A·Filed 2009·Granted Nov 5, 2013·26 cites·22 claims
- 0393US8539438B2System and method for efficient creation and reconciliation of macro and micro level test plansBASSIN KATHRYN A·Filed 2009·Granted Sep 17, 2013·36 cites·22 claims
- 0493US7917897B2Defect resolution methodology and target assessment process with a software systemIBM·Filed 2007·Granted Mar 29, 2011·60 cites·19 claims
- 0592US9052981B2System and method to map defect reduction data to organizational maturity profiles for defect projection modelingIBM·Filed 2013·Granted Jun 9, 2015·14 cites·20 claims
- 0691US10185649B2System and method for efficient creation and reconciliation of macro and micro level test plansIBM·Filed 2016·Granted Jan 22, 2019·6 cites·20 claims
- 0791US8893086B2System and method for resource modeling and simulation in test planningBASSIN KATHRYN A·Filed 2009·Granted Nov 18, 2014·24 cites·26 claims
- 0891US8645921B2System and method to determine defect risks in software solutionsIBM·Filed 2013·Granted Feb 4, 2014·14 cites·15 claims
- 0990US8689188B2System and method for analyzing alternatives in test plansBASSIN KATHRYN A·Filed 2009·Granted Apr 1, 2014·25 cites·27 claims
- 1088US9558464B2System and method to determine defect risks in software solutionsIBM·Filed 2014·Granted Jan 31, 2017·9 cites·12 claims
- 1182US7757125B2Defect resolution methodology and data defects quality/risk metric model extensionIBM·Filed 2007·Granted Jul 13, 2010·19 cites·8 claims
- 1279US8924936B2System and method to classify automated code inspection services defect output for defect analysisIBM·Filed 2013·Granted Dec 30, 2014·3 cites·18 claims
- 1378US8635056B2System and method for system integration test (SIT) planningBASSIN KATHRYN A·Filed 2012·Granted Jan 21, 2014·3 cites·15 claims
- 1475US8527955B2System and method to classify automated code inspection services defect output for defect analysisBAKER IAN E·Filed 2009·Granted Sep 3, 2013·6 cites·25 claims
- 1572US8667458B2System and method to produce business case metrics based on code inspection service resultsBASSIN KATHRYN A·Filed 2009·Granted Mar 4, 2014·2 cites·22 claims
- 1671US8566805B2System and method to provide continuous calibration estimation and improvement options across a software integration life cycleBASSIN KATHRYN A·Filed 2009·Granted Oct 22, 2013·5 cites·23 claims
- 1767US8352237B2System and method for system integration test (SIT) planningIBM·Filed 2009·Granted Jan 8, 2013·4 cites·21 claims
- 1865US9262736B2System and method for efficient creation and reconciliation of macro and micro level test plansIBM·Filed 2013·Granted Feb 16, 2016·1 cites·19 claims
- 1964US7548542B2Methods and apparatus for transferring dataIBM·Filed 2005·Granted Jun 16, 2009·3 cites·23 claims
- 2058US10235269B2System and method to produce business case metrics based on defect analysis starter (DAS) resultsBASSIN KATHRYN A·Filed 2009·Granted Mar 19, 2019·1 cites·22 claims
- 2153US7047234B2System and method for managing database accessIBM·Filed 2001·Granted May 16, 2006·5 cites·23 claims
- 2241US2014058652A1Traffic information processingIBM·Filed 2013·Application pending·0 cites
- 2339US2007174023A1Methods and apparatus for considering a project environment during defect analysisIBM·Filed 2006·Application pending·0 cites
- 2436US2006265188A1Methods and apparatus for defect reduction analysisIBM·Filed 2005·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →