Inventor · disambiguated record
Sven Boldt
Also filed as: BOLDT SVEN
10 granted patents·6 pending applications·37 citations·filing 2002–2005
85Inventor score
Top patents by PatentIndex Score
16 records- 0164US7321497B2Electronic circuit apparatus and method for stacking electronic circuit unitsINFINEON TECHNOLOGIES AG·Filed 2005·Granted Jan 22, 2008·3 cites·19 claims
- 0264US7184335B2Electronic memory apparatus, and method for deactivating redundant bit lines or word linesINFINEON TECHNOLOGIES AG·Filed 2005·Granted Feb 27, 2007·6 cites·7 claims
- 0360US7266038B2Method for activating and deactivating electronic circuit units and circuit arrangement for carrying out the methodINFINEON TECHNOLOGIES AG·Filed 2005·Granted Sep 4, 2007·5 cites·11 claims
- 0457US6961273B2RAM memory circuit having a plurality of banks and an auxiliary device for testingINFINEON TECHNOLOGIES AG·Filed 2004·Granted Nov 1, 2005·10 cites·20 claims
- 0552US7117407B2Method for testing a semiconductor memory having a plurality of memory banksINFINEON TECHNOLOGIES AG·Filed 2003·Granted Oct 3, 2006·8 cites·9 claims
- 0646US6704676B2Method and circuit configuration for identifying an operating property of an integrated circuitINFINEON TECHNOLOGIES AG·Filed 2002·Granted Mar 9, 2004·4 cites·8 claims
- 0745US2005108461A1Memory apparatus having redundancy, and method for storing dataINFINEON TECHNOLOGIES AG·Filed 2004·Application pending·0 cites
- 0844US7281184B2Test system and method for testing a circuitINFINEON TECHNOLOGIES AG·Filed 2005·Granted Oct 9, 2007·1 cites·12 claims
- 0939US2005283258A1Method for controlling command sequences, and command control device for carrying out the methodTHALMANN ERWIN·Filed 2005·Application pending·0 cites
- 1033US7219029B2Method for testing a memory device and memory device for carrying out the methodINFINEON TECHNOLOGIES AG·Filed 2005·Granted May 15, 2007·0 cites·15 claims
- 1133US2005270865A1Test apparatus with memory data converter for redundant bit and word linesINFINEON TECHNOLOGIES AG·Filed 2005·Application pending·0 cites
- 1232US7308622B2Integrated memory and method for testing the memoryINFINEON TECHNOLOGIES AG·Filed 2003·Granted Dec 11, 2007·0 cites·18 claims
- 1332US2006010359A1Method for testing electronic circuit units and test apparatusINFINEON TECHNOLOGIES AG·Filed 2005·Application pending·0 cites
- 1432US2006242518A1Method for verification of electronic circuit units, and an apparatus for carrying out the methodINFINEON TECHNOLOGIES AG·Filed 2005·Application pending·0 cites
- 1532US2006064261A1Method for testing a memory using an external test chip, and apparatus for carrying out the methodINFINEON TECHNOLOGIES AG·Filed 2005·Application pending·0 cites
- 1629US7292479B2Memory device with multistage sense amplifierINFINEON TECHNOLGOIES AG·Filed 2005·Granted Nov 6, 2007·0 cites·8 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →