Inventor · disambiguated record
Svend A. Lund
Also filed as: LUND SVEND · LUND SVEND A · LUND SVEND AAGE
11 granted patents·173 citations·filing 1973–1990
91Inventor score
Files withAKAD TEKN VIDENSKABER11
Top patents by PatentIndex Score
11 records- 0179US4088866AMethod and an apparatus for automatic electric weldingAKAD TEKN VIDENSKABER·Filed 1976·Granted May 9, 1978·37 cites·12 claims
- 0265US4030343AApparatus for providing an ultrasonic sectional view stating the proportion of meat and lard in biological materialAKAD TEKN VIDENSKABER·Filed 1975·Granted Jun 21, 1977·21 cites·4 claims
- 0362US4908774ASystem for ultrasonic examinationAKAD TEKN VIDENSKABER·Filed 1986·Granted Mar 13, 1990·27 cites·4 claims
- 0458US3939697AMethod and apparatus for ultrasonic examinationAKAD TEKN VIDENSKABER·Filed 1973·Granted Feb 24, 1976·14 cites·31 claims
- 0551US4679448ASystem for the internal inspection of pipelinesAKAD TEKN VIDENSKABER·Filed 1985·Granted Jul 14, 1987·15 cites·4 claims
- 0649US4088030AApparatus for ultrasonic examinationAKAD TEKN VIDENSKABER·Filed 1976·Granted May 9, 1978·12 cites·2 claims
- 0748US4226122AApparatus for recording echo pulsesAKAD TEKN VIDENSKABER·Filed 1978·Granted Oct 7, 1980·14 cites·9 claims
- 0842US5111696AMethod of visualizing reflection characteristic in ultrasonic examinationAKAD TEKN VIDENSKABER·Filed 1990·Granted May 12, 1992·12 cites·26 claims
- 0941US3962909AMethod and apparatus for ultrasonic examinationAKAD TEKN VIDENSKABER·Filed 1974·Granted Jun 15, 1976·7 cites·27 claims
- 1037US4911014AMethod of analyzing and evaluating the results of an ultrasonic examinationAKAD TEKN VIDENSKABER·Filed 1988·Granted Mar 27, 1990·9 cites·3 claims
- 1127US4530243AMethod for determining the position of a measuring sensor or a probeAKAD TEKN VIDENSKABER·Filed 1983·Granted Jul 23, 1985·5 cites·7 claims
Join the waitlist — get patent alerts
Get an alert when Svend A. Lund files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →