Inventor · disambiguated record
Syun-Jie Jhan
Also filed as: JHAN SYUN-JIE
2 granted patents·2 citations·filing 2011–2014
41Inventor score
Technology areasH01J
Top patents by PatentIndex Score
2 records- 0161US8633439B2System and method for electromagnetic interference shielding for critical dimension-scanning electron microscopeTSAO CHIA-CHI·Filed 2011·Granted Jan 21, 2014·2 cites·20 claims
- 0252US8952330B2System and method for electromagnetic interference shielding for critical dimension-scanning electron microscopeTAIWAN SEMICONDUCTOR MFG·Filed 2014·Granted Feb 10, 2015·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →