Inventor · disambiguated record
Syun Noguchi
Also filed as: NOGUCHI SYUN
2 granted patents·32 citations·filing 1998–1999
61Inventor score
Files withTOKYO SEIMITSU CO LTD2
Top patents by PatentIndex Score
2 records- 0154US6456318B1Defect inspection apparatus and method by comparing two pairs of areas adjacent to one anotherTOKYO SEIMITSU CO LTD·Filed 1999·Granted Sep 24, 2002·23 cites·8 claims
- 0236US6504574B1Image sensor with scan direction signal charge transfer partsTOKYO SEIMITSU CO LTD·Filed 1998·Granted Jan 7, 2003·9 cites·4 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →