Inventor · disambiguated record
Sze-Kwang Tan
Also filed as: TAN SZE KWANG
11 granted patents·35 citations·filing 2001–2018
87Inventor score
Files withST MICROELECTRONICS ASIA4ST MICROELECTRONICS ASIA PACIFIC PTE LTD4ANGELINI PAOLO1GUEDON YANNICK1TAN SZE-KWANG1
Top patents by PatentIndex Score
11 records- 0193US9389256B2High signal to noise ratio capacitive sensing analog front-endST MICROELECTRONICS ASIA·Filed 2012·Granted Jul 12, 2016·12 cites·30 claims
- 0284US9874986B2Compensation for variations in a capacitive sense matrixST MICROELECTRONICS ASIA PACIFIC PTE LTD·Filed 2015·Granted Jan 23, 2018·3 cites·12 claims
- 0378US9128573B2High signal to noise ratio capacitive sensing analog front-endANGELINI PAOLO·Filed 2012·Granted Sep 8, 2015·7 cites·24 claims
- 0476US9665215B2Method and circuit for parasitic capacitance cancellation for self capacitance sensingST MICROELECTRONICS ASIA PACIFIC PTE LTD·Filed 2013·Granted May 30, 2017·4 cites·30 claims
- 0562US10209844B2Compensation for variations in a capacitive sense matrixST MICROELECTRONICS ASIA PACIFIC PTE LTD·Filed 2018·Granted Feb 19, 2019·0 cites·25 claims
- 0661US10013130B2Compensation for variations in a capacitive sense matrixST MICROELECTRONICS ASIA PACIFIC PTE LTD·Filed 2017·Granted Jul 3, 2018·0 cites·18 claims
- 0753US8705217B2Electrostatic discharge protection circuitGUEDON YANNICK·Filed 2008·Granted Apr 22, 2014·2 cites·9 claims
- 0850US8030988B2Method for generating multiple incremental output voltages using a single charge pump chainST MICROELECTRONICS ASIA·Filed 2009·Granted Oct 4, 2011·4 cites·14 claims
- 0948US9223448B2Compensation for variations in a capacitive sense matrixTAN SZE-KWANG·Filed 2012·Granted Dec 29, 2015·0 cites·18 claims
- 1047US7161411B2Circuit, method and system for generating a non-linear transfer characteristicST MICROELECTRONICS ASIA·Filed 2001·Granted Jan 9, 2007·3 cites·31 claims
- 1145US7777432B2Horizontal and vertical dynamic correction in CRT monitorsST MICROELECTRONICS ASIA·Filed 2002·Granted Aug 17, 2010·0 cites·25 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →