Inventor · disambiguated record
Taewoong Ahn
Also filed as: AHN Taewoong
2 granted patents·0 citations·filing 2016–2023
22Inventor score
Top patents by PatentIndex Score
2 records- 0156US12411175B2Integrated circuit package for scan testing semiconductor chip, operating method of integrated circuit package, and integrated circuitSAMSUNG ELECTRONICS CO LTD·Filed 2023·Granted Sep 9, 2025·0 cites·19 claims
- 0222US9785825B2Method for estimating disparity search range to which multi-level disparity image division is applied, and stereo image matching device using the sameKYUNGPOOK NAT UNIV INDUSTRY—ACADEMIC COOP FOUND·Filed 2016·Granted Oct 10, 2017·0 cites·13 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →