Inventor · disambiguated record
Takashi Aoyama
Also filed as: AOYAMA TAKASHI · KOHARA RIKUSEI
77 granted patents·18 pending applications·1,445 citations·filing 1977–2023
99Inventor score
Top patents by PatentIndex Score
95 records- 0195US7534957B2Cord switch and detecting apparatus using the sameHITACHI CABLE·Filed 2006·Granted May 19, 2009·34 cites·17 claims
- 0295US5294811AThin film semiconductor device having inverted stagger structure, and device having such semiconductor deviceHITACHI LTD·Filed 1991·Granted Mar 15, 1994·170 cites·24 claims
- 0395US5247375ADisplay device, manufacturing method thereof and display panelHITACHI LTD·Filed 1992·Granted Sep 21, 1993·165 cites·25 claims
- 0493US7250601B2Energy spectrum measuring apparatus, electron energy loss spectrometer, electron microscope provided therewith, and electron energy loss spectrum measuring methodHITACHI HIGH TECH CORP·Filed 2006·Granted Jul 31, 2007·15 cites·8 claims
- 0592US8314513B2Power transmission control device, power transmission device, power reception control device, power reception device, electronic apparatus, and contactless power transmission systemAOYAMA TAKASHI·Filed 2010·Granted Nov 20, 2012·28 cites·15 claims
- 0691US7928376B2Element mapping unit, scanning transmission electron microscope, and element mapping methodHITACHI LTD·Filed 2005·Granted Apr 19, 2011·15 cites·9 claims
- 0791US5367171AElectron microscope specimen holderHITACHI LTD·Filed 1992·Granted Nov 22, 1994·74 cites·19 claims
- 0890US7663179B2Semiconductor device with rewritable nonvolatile memory cellRENESAS TECH CORP·Filed 2006·Granted Feb 16, 2010·14 cites·14 claims
- 0989US6703613B2Energy spectrum measuring apparatus, electron energy loss spectrometer, electron microscope provided therewith, and electron energy loss spectrum measuring methodHITACHI LTD·Filed 2001·Granted Mar 9, 2004·28 cites·12 claims
- 1088US10431348B2Pressure sensor including electrical conductors comprising electroconductive resin composition that does not need cross-linkingHITACHI METALS LTD·Filed 2018·Granted Oct 1, 2019·1 cites·14 claims
- 1188US9991022B2Electroconductive resin composition and pressure sensorHITACHI METALS LTD·Filed 2014·Granted Jun 5, 2018·4 cites·14 claims
- 1288US6845610B2Exhaust gas purification apparatus and methodNISSAN MOTOR·Filed 2001·Granted Jan 25, 2005·48 cites·13 claims
- 1388US4954855AThin film transistor formed on insulating substrateHITACHI LTD·Filed 1987·Granted Sep 4, 1990·57 cites·22 claims
- 1486US6297617B1Battery charger and charge control circuitTOYODA AUTOMATIC LOOM WORKS·Filed 2000·Granted Oct 2, 2001·54 cites·8 claims
- 1586US5350921AAnalytical electron microscope and a method of operating such an electron microscopeHITACHI LTD·Filed 1993·Granted Sep 27, 1994·49 cites·26 claims
- 1686US5153702AThin film semiconductor device and method for fabricating the sameHITACHI LTD·Filed 1988·Granted Oct 6, 1992·81 cites·15 claims
- 1785US8395474B2Position sensor cord, position sensor and planar position sensorTANBA AKIHIRO·Filed 2012·Granted Mar 12, 2013·8 cites·11 claims
- 1885US6794648B2Ultimate analyzer, scanning transmission electron microscope and ultimate analysis methodHITACHI LTD·Filed 2002·Granted Sep 21, 2004·19 cites·19 claims
- 1984US8395352B2Power transmission control device, power transmission device, electronic apparatus, and load state detection circuitAOYAMA TAKASHI·Filed 2010·Granted Mar 12, 2013·14 cites·19 claims
- 2084US4388342AMethod for chemical vapor depositionHITACHI LTD·Filed 1980·Granted Jun 14, 1983·60 cites·12 claims
- 2182US7348245B2Semiconductor device and a method of manufacturing the sameRENESAS TECH CORP·Filed 2006·Granted Mar 25, 2008·10 cites·13 claims
- 2282US7067805B2Energy spectrum measuring apparatus, electron energy loss spectrometer, electron microscope provided therewith, and electron energy loss spectrum measuring methodHITACHI HIGH TECH CORP·Filed 2004·Granted Jun 27, 2006·17 cites·3 claims
- 2381US9202644B2Cord switch and cord switch mounting structureHITACHI METALS LTD·Filed 2014·Granted Dec 1, 2015·10 cites·9 claims
- 2481US6784340B1Chemical inducible promoter used to obtain transgenic plants with a silent markerUNIV ROCKEFELLER·Filed 1999·Granted Aug 31, 2004·41 cites·15 claims
- 2581US6173690B1In-cylinder direct-injection spark-ignition engineNISSAN MOTOR·Filed 1999·Granted Jan 16, 2001·40 cites·9 claims
- 2680US12031822B2Physical quantity detection circuit, physical quantity sensor, electronic instrument, vehicle, and method for diagnosing failure of physical quantity sensorSEIKO EPSON CORP·Filed 2023·Granted Jul 9, 2024·0 cites·12 claims
- 2780US10777305B2Information processing system, server system, information processing apparatus, and information processing methodNINTENDO CO LTD·Filed 2016·Granted Sep 15, 2020·1 cites·20 claims
- 2880US10288426B2Circuit device, physical-quantity detecting apparatus, electronic apparatus, and moving objectSEIKO EPSON CORP·Filed 2016·Granted May 14, 2019·3 cites·20 claims
- 2980US10031176B2Circuit device, physical quantity detection device, electronic apparatus, and moving objectSEIKO EPSON CORP·Filed 2016·Granted Jul 24, 2018·2 cites·20 claims
- 3079US11214364B2Main rotor blade and helicopterJAPAN AEROSPACE EXPLORATION·Filed 2018·Granted Jan 4, 2022·4 cites·12 claims
- 3179US8951687B2Fuel cell system, and method of stopping fuel cell systemSHIMOI RYOICHI·Filed 2009·Granted Feb 10, 2015·4 cites·23 claims
- 3279US6150657AEnergy filter and electron microscope equipped with the energy filterHITACHI LTD·Filed 1998·Granted Nov 21, 2000·34 cites·15 claims
- 3378US8299807B2Foreign object detection sensor and method for manufacturing the sameSAKAMAKI RYOUSUKE·Filed 2010·Granted Oct 30, 2012·5 cites·29 claims
- 3478US7665100B2Disk driveSONY CORP·Filed 2008·Granted Feb 16, 2010·3 cites·27 claims
- 3578US5119415AMethod of displaying called party information on calling party terminal and communication network using the methodHITACHI LTD·Filed 1989·Granted Jun 2, 1992·48 cites·22 claims
- 3678US2022145060A1Thermoplastic Fluororesin Composition, Electric Wire and CableHITACHI METALS LTD·Filed 2022·Application pending·0 cites
- 3777US12492899B2Physical quantity detection circuit and physical quantity detection deviceSEIKO EPSON CORP·Filed 2023·Granted Dec 9, 2025·0 cites·9 claims
- 3877US11733045B2Physical quantity detection circuit, physical quantity sensor, electronic instrument, vehicle, and method for diagnosing failure of physical quantity sensorSEIKO EPSON CORP·Filed 2022·Granted Aug 22, 2023·0 cites·12 claims
- 3977US9282639B2Adhesive composition, adhesive varnish, adhesive film and wiring filmHITACHI METALS LTD·Filed 2013·Granted Mar 8, 2016·2 cites·8 claims
- 4077US5587856ADisc loading mechanism including a damper mounted in a base plate recessSONY CORP·Filed 1995·Granted Dec 24, 1996·30 cites·9 claims
- 4175US6933501B2Ultimate analyzer, scanning transmission electron microscope and ultimate analysis methodHITACHI LTD·Filed 2004·Granted Aug 23, 2005·10 cites·2 claims
- 4275US6577585B2Skew adjustment for disk drive apparatusSONY CORP·Filed 2000·Granted Jun 10, 2003·10 cites·7 claims
- 4375US2020109274A1Thermoplastic Fluororesin Composition, Electric Wire and CableHITACHI METALS LTD·Filed 2019·Application pending·0 cites
- 4473US7815842B2Method for producing conducting polymer fibers with vinyl and conducting polymer fibers with vinyl produced therebyUNIV YAMANASHI·Filed 2005·Granted Oct 19, 2010·2 cites·18 claims
- 4572US8115125B2Cord switchYASUDA SHUHEI·Filed 2008·Granted Feb 14, 2012·7 cites·12 claims
- 4672US6063985AChemical inducible promotor used to obtain transgenic plants with a silent markerUNIV ROCKEFELLER·Filed 1998·Granted May 16, 2000·27 cites·19 claims
- 4769US11300411B2Physical quantity detection circuit, physical quantity sensor, electronic instrument, vehicle, and method for diagnosing failure of physical quantity sensorSEIKO EPSON CORP·Filed 2020·Granted Apr 12, 2022·0 cites·14 claims
- 4869US10318370B2Circuit device, physical quantity detection device, oscillator, electronic apparatus, vehicle, and method of detecting failure of master clock signalSEIKO EPSON CORP·Filed 2017·Granted Jun 11, 2019·1 cites·18 claims
- 4968US5898177AElectron microscopeHITACHI LTD·Filed 1997·Granted Apr 27, 1999·20 cites·8 claims
- 5067US7118972B2Method of manufacture of a semiconductor deviceRENESAS TECH CORP·Filed 2004·Granted Oct 10, 2006·9 cites·9 claims
Showing the top 50 of 95 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →