Inventor · disambiguated record
Tawfik Arabi
Also filed as: ARABI TAWFIK · ARABI TAWFIK R
14 granted patents·2 pending applications·185 citations·filing 1999–2011
92Inventor score
Top patents by PatentIndex Score
16 records- 0191US6671847B1I/O device testing method and apparatusINTEL CORP·Filed 2000·Granted Dec 30, 2003·73 cites·23 claims
- 0285US6747470B2Method and apparatus for on-die voltage fluctuation detectionINTEL CORP·Filed 2001·Granted Jun 8, 2004·30 cites·9 claims
- 0381US7685445B2Per die voltage programming for energy efficient integrated circuit (IC) operationINTEL CORP·Filed 2006·Granted Mar 23, 2010·14 cites·24 claims
- 0476US7157924B2Method and apparatus for on-die voltage fluctuation detectionINTEL CORP·Filed 2003·Granted Jan 2, 2007·17 cites·30 claims
- 0572US7112979B2Testing arrangement to distribute integrated circuitsINTEL CORP·Filed 2002·Granted Sep 26, 2006·12 cites·14 claims
- 0667US8044697B2Per die temperature programming for thermally efficient integrated circuit (IC) operationINTEL CORP·Filed 2006·Granted Oct 25, 2011·3 cites·19 claims
- 0767US7233162B2Arrangements having IC voltage and thermal resistance designated on a per IC basisINTEL CORP·Filed 2005·Granted Jun 19, 2007·3 cites·14 claims
- 0867US7117114B2On-die temperature control data for communicating to a thermal actuatorINTEL CORP·Filed 2004·Granted Oct 3, 2006·14 cites·23 claims
- 0955US7348790B2AC testing of leakage current in integrated circuits using RC time constantINTEL CORP·Filed 2005·Granted Mar 25, 2008·2 cites·14 claims
- 1052US7109737B2Arrangements having IC voltage and thermal resistance designated on a per IC basisINTEL CORP·Filed 2004·Granted Sep 19, 2006·4 cites·14 claims
- 1144US8461895B2Per die temperature programming for thermally efficient integrated circuit (IC) operationARABI TAWFIK·Filed 2011·Granted Jun 11, 2013·0 cites·20 claims
- 1241US6967496B2AC testing of leakage current in integrated circuits using RC time constantINTEL CORP·Filed 2004·Granted Nov 22, 2005·2 cites·26 claims
- 1339US6777970B2AC testing of leakage current in integrated circuits using RC time constantINTEL CORP·Filed 2001·Granted Aug 17, 2004·1 cites·28 claims
- 1436US2004117673A1Method and apparatus to provide platform load linesFiled 2002·Application pending·0 cites
- 1535US6449742B1Test and characterization of source synchronous AC timing specifications by trace length modulation of accurately controlled interconnect topology of the test unit interfaceINTEL CORP·Filed 1999·Granted Sep 10, 2002·10 cites·19 claims
- 1635US2006226863A1Method and apparatus to adjust die frequencyNARENDRA SIVA G·Filed 2005·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →