Inventor · disambiguated record
Tal Ben-Shlomo
Also filed as: BEN SHLOMO TAL E · BEN-SHLOMO TAL · BEN-SHLOMO TAL ELDAR
9 granted patents·4 pending applications·55 citations·filing 2006–2024
85Inventor score
Top patents by PatentIndex Score
13 records- 0180US11232550B2Generating a training set usable for examination of a semiconductor specimenAPPLIED MATERIALS ISRAEL LTD·Filed 2020·Granted Jan 25, 2022·2 cites·20 claims
- 0261USD542601SHolderGOLDEN G T LLC·Filed 2006·Granted May 15, 2007·13 cites·1 claims
- 0360USD558504SDispenserGOLDEN GT LLC·Filed 2006·Granted Jan 1, 2008·13 cites·1 claims
- 0459US2025264814A1Optimization of a metrology algorithm for examination of semiconductor wafersAPPLIED MATERIALS ISRAEL LTD·Filed 2024·Application pending·0 cites
- 0558USD552417SHolderGOLDEN GT LLC·Filed 2006·Granted Oct 9, 2007·13 cites·1 claims
- 0651US12260543B2Machine learning based examination of a semiconductor specimen and training thereofAPPLIED MATERIALS ISRAEL LTD·Filed 2022·Granted Mar 25, 2025·0 cites·20 claims
- 0751US2024428395A1Optimization of a metrology algorithm for examination of semiconductor specimensAPPLIED MATERIALS ISRAEL LTD·Filed 2023·Application pending·0 cites
- 0851US2007181600A1Multiple spice dispenser deviceBEN-SHLOMO TAL E·Filed 2006·Application pending·0 cites
- 0948US11631179B2Segmentation of an image of a semiconductor specimenAPPLIED MATERIALS ISRAEL LTD·Filed 2020·Granted Apr 18, 2023·0 cites·20 claims
- 1047USD543457SDispenserGOLDEN G T LLC·Filed 2006·Granted May 29, 2007·8 cites·1 claims
- 1145USD543076SHolderGOLDEN G T LLC·Filed 2006·Granted May 22, 2007·6 cites·1 claims
- 1239US11301987B2Determining locations of suspected defectsAPPLIED MATERIALS ISRAEL LTD·Filed 2020·Granted Apr 12, 2022·0 cites·13 claims
- 1336US2007181613A1Powder dispenserBEN-SHLOMO TAL E·Filed 2006·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →