Inventor · disambiguated record

Tai Wai David Chik

Also filed as: CHIK TAI WAI DAVID

1 granted patent·0 citations·filing 2022–2022

2Inventor score

Technology areasG01N

Files withHONG KONG APPLIED SCIENCE & TECH RESEARCH INST CO LTD1

Top patents by PatentIndex Score

1 record

0153US12063442B2Optimized path planning for defect inspection based on effective region coverageHONG KONG APPLIED SCIENCE & TECH RESEARCH INST CO LTD·Filed 2022·Granted Aug 13, 2024·0 cites·19 claims

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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →