Inventor · disambiguated record
Takashi Dobashi
Also filed as: DOBASHI TAKASHI
7 granted patents·2 pending applications·5 citations·filing 2009–2023
71Inventor score
Top patents by PatentIndex Score
9 records- 0184US11177108B2Charged particle beam application apparatusHITACHI HIGH TECH CORP·Filed 2018·Granted Nov 16, 2021·4 cites·15 claims
- 0260US2025005701A1Evaluation method, search method, and search systemHITACHI HIGH TECH CORP·Filed 2023·Application pending·0 cites
- 0358US10636621B2Charged particle beam device for moving an aperture having plurality of openings and sample observation methodHITACHI HIGH TECH CORP·Filed 2015·Granted Apr 28, 2020·1 cites·4 claims
- 0450US12222690B2Process recipe search apparatus, etching recipe search method and semiconductor device manufacturing systemHITACHI HIGH TECH CORP·Filed 2021·Granted Feb 11, 2025·0 cites·12 claims
- 0549US2011049344A1Diffraction pattern capturing method and charged particle beam deviceHITACHI LTD·Filed 2009·Application pending·0 cites
- 0645US11791131B2Charged particle beam apparatus and method for controlling charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2019·Granted Oct 17, 2023·0 cites·7 claims
- 0745US11742172B2Charged particle beam device and control method thereofHITACHI HIGH TECH CORP·Filed 2019·Granted Aug 29, 2023·0 cites·15 claims
- 0844US11380518B2Measurement system and method for setting observation conditions of measurement apparatusHITACHI LTD·Filed 2019·Granted Jul 5, 2022·0 cites·14 claims
- 0943US11756764B2Charged particle beam apparatus and method of controlling charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2019·Granted Sep 12, 2023·0 cites·14 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →