Inventor · disambiguated record

Takako Fujisawa

Also filed as: FUJISAWA TAKAKO

3 granted patents·1 pending application·17 citations·filing 2004–2009

66Inventor score

Technology areasG06T

Files withHITACHI HIGH TECH CORP4

Top patents by PatentIndex Score

4 records

0180US8036447B2Inspection apparatus for inspecting patterns of a substrateHITACHI HIGH TECH CORP·Filed 2009·Granted Oct 11, 2011·10 cites·3 claims
0255US7421110B2Image processing unit for wafer inspection toolHITACHI HIGH TECH CORP·Filed 2004·Granted Sep 2, 2008·6 cites·8 claims
0353US7889911B2Image processing unit for wafer inspection toolHITACHI HIGH TECH CORP·Filed 2008·Granted Feb 15, 2011·1 cites·8 claims
0444US2006171593A1Inspection apparatus for inspecting patterns of a substrateHITACHI HIGH TECH CORP·Filed 2006·Application pending·0 cites

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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →