Inventor · disambiguated record
Tatsuya Fujishima
Also filed as: FUJISHIMA TATSUYA
9 granted patents·4 pending applications·12 citations·filing 2001–2025
80Inventor score
Files withSANYO ELECTRIC CO4KIOXIA CORP3TOSHIBA MEMORY CORP3MASSACHUSETTS INST TECHNOLOGY1ROHM CO LTD1
Top patents by PatentIndex Score
13 records- 0175US12294021B2Semiconductor memory deviceKIOXIA CORP·Filed 2024·Granted May 6, 2025·0 cites·20 claims
- 0272US2025234620A1Semiconductor memory deviceKIOXIA CORP·Filed 2025·Application pending·0 cites
- 0365US9337301B2Aluminum nitride based semiconductor devicesMASSACHUSETTS INST TECHNOLOGY·Filed 2012·Granted May 10, 2016·2 cites·16 claims
- 0464US11984484B2Semiconductor memory deviceKIOXIA CORP·Filed 2021·Granted May 14, 2024·0 cites·20 claims
- 0563US10777574B2Semiconductor device and method of manufacturing semiconductor deviceTOSHIBA MEMORY CORP·Filed 2019·Granted Sep 15, 2020·1 cites·19 claims
- 0657US7066786B2Method of dressing polishing pad and polishing apparatusROHM CO LTD·Filed 2004·Granted Jun 27, 2006·7 cites·9 claims
- 0747US7224038B2Semiconductor device having element isolation trench and method of fabricating the sameSANYO ELECTRIC CO·Filed 2001·Granted May 29, 2007·2 cites·4 claims
- 0839US2011125075A1Method for control of electroporation apparatusUNIV NAGOYA NAT UNIV CORP·Filed 2006·Application pending·0 cites
- 0937US2006113584A1Manufacturing method of a semiconductor deviceSANYO ELECTRIC CO·Filed 2005·Application pending·0 cites
- 1036US2020066748A1Semiconductor memory deviceTOSHIBA MEMORY CORP·Filed 2018·Application pending·0 cites
- 1134US10026743B2Semiconductor memory device and method for manufacturing sameTOSHIBA MEMORY CORP·Filed 2016·Granted Jul 17, 2018·0 cites·17 claims
- 1234US7419874B2Method of manufacturing semiconductor device with capacitor and transistorSANYO ELECTRIC CO·Filed 2006·Granted Sep 2, 2008·0 cites·8 claims
- 1330US6849550B2Method for manufacturing semiconductor deviceSANYO ELECTRIC CO·Filed 2002·Granted Feb 1, 2005·0 cites·16 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →