Inventor · disambiguated record
Takeshi Fukuma
Also filed as: FUKUMA TAKESHI
11 granted patents·42 citations·filing 2004–2014
87Inventor score
Top patents by PatentIndex Score
11 records- 0174US8839461B2Potential measurement device and atomic force microscopeFUKUMA TAKESHI·Filed 2012·Granted Sep 16, 2014·5 cites·5 claims
- 0272US8166848B2Transmission caseUOZUMI SHINGO·Filed 2009·Granted May 1, 2012·9 cites·8 claims
- 0367US8341760B2Scanning probe microscopeFUKUMA TAKESHI·Filed 2010·Granted Dec 25, 2012·3 cites·13 claims
- 0466US8387159B2Scanning type probe microscopeUNIV KANAZAWA NAT UNIV CORP·Filed 2009·Granted Feb 26, 2013·4 cites·10 claims
- 0563US10215686B2Metal corrosion resistance evaluation method and evaluation device using in-liquid potential measurementHITACHI LTD·Filed 2013·Granted Feb 26, 2019·1 cites·14 claims
- 0661US7363614B2Automatic test program generation methodHITACHI LTD·Filed 2004·Granted Apr 22, 2008·13 cites·17 claims
- 0758US8323139B2Vehicle drive deviceIKE NOBUKAZU·Filed 2009·Granted Dec 4, 2012·4 cites·17 claims
- 0855US8505111B2Cantilever excitation device and scanning probe microscopeASAKAWA HITOSHI·Filed 2010·Granted Aug 6, 2013·2 cites·11 claims
- 0949US8217367B2Scanner device for scanning probe microscopeFUKUMA TAKESHI·Filed 2009·Granted Jul 10, 2012·1 cites·13 claims
- 1038US9535088B2Signal detection circuit and scanning probe microscopeNAT UNIV CORP KANAZAWA UNIV·Filed 2014·Granted Jan 3, 2017·0 cites·8 claims
- 1129US9110093B2Sealed AFM cellUNIV KANAZAWA NAT UNIV CORP·Filed 2012·Granted Aug 18, 2015·0 cites·5 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →