Inventor · disambiguated record
Takaaki Fukumoto
Also filed as: FUKUMOTO TAKAAKI
43 granted patents·1,450 citations·filing 1981–1999
99Inventor score
Files withMITSUBISHI ELECTRIC CORP34TAIYO SANSO CO LTD4DAN SCIENCE CO LTD1NIPPON RENSUI COMPANY1SHINETSU CHEMICAL CO1
Top patents by PatentIndex Score
43 records- 0191US5216890ADevice for and method of producing hyperfine frozen particlesMITSUBISHI ELECTRIC CORP·Filed 1992·Granted Jun 8, 1993·65 cites·10 claims
- 0291US4465529AMethod of producing semiconductor deviceMITSUBISHI ELECTRIC CORP·Filed 1982·Granted Aug 14, 1984·81 cites·9 claims
- 0390US5283989AApparatus for polishing an article with frozen particlesMITSUBISHI ELECTRIC CORP·Filed 1990·Granted Feb 8, 1994·89 cites·3 claims
- 0488US5380471AAeration apparatus for producing ultrapure waterMITSUBISHI ELECTRIC CORP·Filed 1994·Granted Jan 10, 1995·75 cites·5 claims
- 0586US4834137ASafety device for vessels of compressed gasesMITSUBISHI ELECTRIC CORP·Filed 1988·Granted May 30, 1989·55 cites·10 claims
- 0685US5147466AMethod of cleaning a surface by blasting the fine frozen particles against the surfaceMITSUBISHI ELECTRIC CORP·Filed 1990·Granted Sep 15, 1992·52 cites·4 claims
- 0785US4932168AProcessing apparatus for semiconductor wafersTAIYO SANSO CO LTD·Filed 1988·Granted Jun 12, 1990·60 cites·12 claims
- 0880US5025597AProcessing apparatus for semiconductor wafersTAIYO SANSO CO LTD·Filed 1990·Granted Jun 25, 1991·58 cites·6 claims
- 0980US4974375AIce particle forming and blasting deviceMITSUBISHI ELECTRIC CORP·Filed 1989·Granted Dec 4, 1990·55 cites·11 claims
- 1080US4719088AApparatus for removing at least one acidic component from a gasMITSUBISHI ELECTRIC CORP·Filed 1986·Granted Jan 12, 1988·60 cites·1 claims
- 1179US5035750AProcessing method for semiconductor wafersTAIYO SANSO CO LTD·Filed 1990·Granted Jul 30, 1991·56 cites·19 claims
- 1278US5940688AEpoxy resin composition and semiconductor device encapsulated therewithSHINETSU CHEMICAL CO·Filed 1997·Granted Aug 17, 1999·57 cites·10 claims
- 1376US4986216ASemiconductor manufacturing apparatusMITSUBISHI ELECTRIC CORP·Filed 1989·Granted Jan 22, 1991·46 cites·19 claims
- 1475US5259972AApparatus and method for purifying waterNIPPON RENSUI COMPANY·Filed 1991·Granted Nov 9, 1993·49 cites·9 claims
- 1574US5470461AApparatus for producing pure waterMITSUBISHI ELECTRIC CORP·Filed 1992·Granted Nov 28, 1995·35 cites·15 claims
- 1673US5336356AApparatus for treating the surface of a semiconductor substrateMITSUBISHI ELECTRIC CORP·Filed 1992·Granted Aug 9, 1994·55 cites·4 claims
- 1772US5074083ACleaning device using fine frozen particlesMITSUBISHI ELECTRIC CORP·Filed 1991·Granted Dec 24, 1991·30 cites·6 claims
- 1872US4893320AApparatus for counting particles attached to surfaces of a solidMITSUBISHI ELECTRIC CORP·Filed 1988·Granted Jan 9, 1990·31 cites·19 claims
- 1970US5246586AApparatus and method for producing ultrapure water and method of controlling the apparatusMITSUBISHI ELECTRIC CORP·Filed 1992·Granted Sep 21, 1993·32 cites·15 claims
- 2070US5053064AAir conditioning apparatus for a clean roomMITSUBISHI ELECTRIC CORP·Filed 1990·Granted Oct 1, 1991·33 cites·18 claims
- 2169US4765963AApparatus for measuring impurities in waterMITSUBISHI ELECTRIC CORP·Filed 1986·Granted Aug 23, 1988·28 cites·2 claims
- 2266US5186907AApparatus for treating organic waste gasMITSUBISHI ELECTRIC CORP·Filed 1988·Granted Feb 16, 1993·28 cites·25 claims
- 2366US4941489ACarrier cleaning and drying apparatusDAN SCIENCE CO LTD·Filed 1989·Granted Jul 17, 1990·36 cites·9 claims
- 2464US5752985AClean room having an air conditioning systemMITSUBISHI ELECTRIC CORP·Filed 1997·Granted May 19, 1998·40 cites·15 claims
- 2564US4869090AMethod of processing base plate for magnetic discMITSUBISHI ELECTRIC CORP·Filed 1988·Granted Sep 26, 1989·15 cites·3 claims
- 2659US4786473AApparatus for measuring impurities in pure waterMITSUBISHI ELECTRIC CORP·Filed 1986·Granted Nov 22, 1988·20 cites·6 claims
- 2757US5081068AMethod of treating surface of substrate with ice particles and hydrogen peroxideMITSUBISHI ELECTRIC CORP·Filed 1990·Granted Jan 14, 1992·27 cites·8 claims
- 2854US4868996AMethod and apparatus for vapor dryingMITSUBISHI ELECTRIC CORP·Filed 1988·Granted Sep 26, 1989·20 cites·9 claims
- 2953US6221323B1Method for producing super clean airTAIYO TOYO SANSO CO LTD·Filed 1998·Granted Apr 24, 2001·17 cites·17 claims
- 3053US6207296B1Inorganic filler, epoxy resin composition, and semiconductor deviceMITSUBISHI ELECTRIC CORP·Filed 1999·Granted Mar 27, 2001·15 cites·6 claims
- 3153US5827339AApparatus for generating chemical-free dry airMITSUBISHI ELECTRIC CORP·Filed 1997·Granted Oct 27, 1998·25 cites·9 claims
- 3253US5554295AMethod for producing pure waterMITSUBISHI ELECTRIC CORP·Filed 1995·Granted Sep 10, 1996·16 cites·4 claims
- 3347US4820650AIntroducing lattice defect with ice particles in semiconductor waferMITSUBISHI ELECTRIC CORP·Filed 1987·Granted Apr 11, 1989·17 cites·7 claims
- 3446US5935314AInorganic filler, epoxy resin composition, and semiconductor deviceMITSUBISHI ELECTRIC CORP·Filed 1997·Granted Aug 10, 1999·11 cites·6 claims
- 3544US5048331AContinuous rainwater monitoring systemMITSUBISHI ELECTRIC CORP·Filed 1990·Granted Sep 17, 1991·11 cites·8 claims
- 3643US4696184ADevice for measuring the absolute value of the density of salts in atmosphereMITSUBISHI ELECTRIC CORP·Filed 1985·Granted Sep 29, 1987·9 cites·16 claims
- 3740US5129198ACleaning device for semiconductor wafersTAIYO SANSO CO LTD·Filed 1991·Granted Jul 14, 1992·11 cites·11 claims
- 3839US4778584ALiquid filter deviceZEOTEC LRC CORP·Filed 1986·Granted Oct 18, 1988·9 cites·9 claims
- 3935US4569224ADevice for measuring the absolute value of the density of salts in atmosphereMITSUBISHI ELECTRIC CORP·Filed 1984·Granted Feb 11, 1986·4 cites·1 claims
- 4033US4411929AMethod for manufacturing semiconductor deviceMITSUBISHI ELECTRIC CORP·Filed 1981·Granted Oct 25, 1983·6 cites·6 claims
- 4132US5344615AWet-process apparatusMITSUBISHI ELECTRIC CORP·Filed 1993·Granted Sep 6, 1994·7 cites·13 claims
- 4230US4624834ADevice for measuring the absolute value of the density of salts in atmosphereMITSUBISHI ELECTRIC CORP·Filed 1984·Granted Nov 25, 1986·1 cites·12 claims
- 4330US4600888ADevice for continuously monitoring the density of atmospheric sodium ionsMITSUBISHI ELECTRIC CORP·Filed 1984·Granted Jul 15, 1986·3 cites·4 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →