Inventor · disambiguated record
Takahide Hatahori
Also filed as: HATAHORI TAKAHIDE
21 granted patents·4 pending applications·17 citations·filing 2013–2022
90Inventor score
Top patents by PatentIndex Score
25 records- 0193US10267618B2Defect detection method and defect detection apparatusSHIMADZU CORP·Filed 2017·Granted Apr 23, 2019·7 cites·13 claims
- 0286US11226294B2Defect inspection apparatusSHIMADZU CORP·Filed 2020·Granted Jan 18, 2022·2 cites·24 claims
- 0384US11193887B2Defect detection method and deviceSHIMADZU CORP·Filed 2018·Granted Dec 7, 2021·2 cites·11 claims
- 0484US11181510B2Inspection apparatus and inspection methodSHIMADZU CORP·Filed 2019·Granted Nov 23, 2021·2 cites·13 claims
- 0583US10317190B2Vibration measurement deviceSHIMADZU CORP·Filed 2018·Granted Jun 11, 2019·2 cites·18 claims
- 0678US10429172B2Defect detection method and defect detection deviceSHIMADZU CORP·Filed 2018·Granted Oct 1, 2019·1 cites·17 claims
- 0774US10942152B2Defect inspection device and methodSHIMADZU CORP·Filed 2016·Granted Mar 9, 2021·1 cites·8 claims
- 0867US12099000B2Defect detection device and defect detection methodSHIMADZU CORP·Filed 2022·Granted Sep 24, 2024·0 cites·9 claims
- 0959US11982641B2Method and device for examining clinched portion of tubular bodySHIMADZU CORP·Filed 2020·Granted May 14, 2024·0 cites·8 claims
- 1058US12482086B2Defect inspection apparatusSHIMADZU CORP·Filed 2021·Granted Nov 25, 2025·0 cites·17 claims
- 1158US12320781B2Joined body testing method, joined body testing device, and joined bodyKOBE STEEL LTD·Filed 2021·Granted Jun 3, 2025·0 cites·16 claims
- 1258US12188769B2Defect inspection device and defect inspection methodSHIMADZU CORP·Filed 2020·Granted Jan 7, 2025·0 cites·11 claims
- 1358US11977032B2Displacement measurement device and defect detection deviceSHIMADZU CORP·Filed 2019·Granted May 7, 2024·0 cites·10 claims
- 1455US11391700B2Defect detection deviceSHIMADZU CORP·Filed 2019·Granted Jul 19, 2022·0 cites·6 claims
- 1554US12360052B2Defect inspection apparatus and defect inspection methodSHIMADZU CORP·Filed 2020·Granted Jul 15, 2025·0 cites·10 claims
- 1654US2023304787A1Defect detection device and defect detection methodSHIMADZU CORP·Filed 2022·Application pending·0 cites
- 1753US11815493B2Defect inspection apparatus and defect inspection methodSHIMADZU CORP·Filed 2018·Granted Nov 14, 2023·0 cites·6 claims
- 1852US12111266B2Vibration measurement deviceSHIMADZU CORP·Filed 2018·Granted Oct 8, 2024·0 cites·2 claims
- 1952US2023114484A1Inspection system, image processing method, and defect inspection deviceSHIMADZU CORP·Filed 2022·Application pending·0 cites
- 2051US9551617B2Raman spectroscopic analyzerSHIMADZU CORP·Filed 2014·Granted Jan 24, 2017·0 cites·8 claims
- 2147US11790513B2Defect inspection apparatus and defect inspection methodSHIMADZU CORP·Filed 2019·Granted Oct 17, 2023·0 cites·19 claims
- 2247US11774746B2Interference image imaging apparatusSHIMADZU CORP·Filed 2020·Granted Oct 3, 2023·0 cites·14 claims
- 2346US10288550B2Flow cellSHIMADZU CORP·Filed 2013·Granted May 14, 2019·0 cites·6 claims
- 2445US2014063494A1Flow cellSHIMADZU CORP·Filed 2013·Application pending·0 cites
- 2541US2022051390A1Defect inspection apparatus and defect inspection methodSHIMADZU CORP·Filed 2018·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →