Inventor · disambiguated record
Takahisa Hiraide
Also filed as: HIRAIDE TAKAHISA
11 granted patents·119 citations·filing 1997–2012
89Inventor score
Top patents by PatentIndex Score
11 records- 0187US7734973B2Testing apparatus and testing method for an integrated circuit, and integrated circuitFUJITSU MICROELECTRONICS LTD·Filed 2006·Granted Jun 8, 2010·17 cites·4 claims
- 0282US7178078B2Testing apparatus and testing method for an integrated circuit, and integrated circuitFUJITSU LTD·Filed 2001·Granted Feb 13, 2007·38 cites·26 claims
- 0372US7337379B2Apparatus and method for diagnosing integrated circuitFUJITSU LTD·Filed 2003·Granted Feb 26, 2008·17 cites·6 claims
- 0471US7266746B2Device and method for testing integrated circuitFUJITSU LTD·Filed 2004·Granted Sep 4, 2007·16 cites·19 claims
- 0570US7757138B2Semiconductor integrated circuit, test data generating device, LSI test device, and computer productFUJITSU LTD·Filed 2007·Granted Jul 13, 2010·6 cites·8 claims
- 0664US7895492B2Pseudorandom number generator, semiconductor integrated circuit, pseudorandom number generator control apparatus, pseudorandom number generator control method, and computer productFUJITSU LTD·Filed 2008·Granted Feb 22, 2011·4 cites·16 claims
- 0754US5815513ATest pattern preparation systemFUJITSU LTD·Filed 1997·Granted Sep 29, 1998·19 cites·3 claims
- 0850US8644093B2Writing circuit, semiconductor integrated circuit and writing methodHIRAIDE TAKAHISA·Filed 2012·Granted Feb 4, 2014·1 cites·7 claims
- 0949US7761761B2Semiconductor integrated circuit, test data generating device, LSI test device, and computer productFUJITSU LTD·Filed 2007·Granted Jul 20, 2010·1 cites·3 claims
- 1037US8166380B2Method and apparatus for identifying paths having appropriate lengths for fault simulationHIRAIDE TAKAHISA·Filed 2006·Granted Apr 24, 2012·0 cites·14 claims
- 1135US8081528B2Integrated circuit and method for testing the circuitHIRAIDE TAKAHISA·Filed 2009·Granted Dec 20, 2011·0 cites·13 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →