Inventor · disambiguated record
Takenori Hirose
Also filed as: HIROSE TAKENORI
26 granted patents·6 pending applications·343 citations·filing 1999–2023
95Inventor score
Top patents by PatentIndex Score
32 records- 0196US9304145B2Inspection method and its apparatus for thermal assist type magnetic head elementHITACHI HIGH TECH FINE SYSTEMS CORP·Filed 2015·Granted Apr 5, 2016·68 cites·16 claims
- 0294US7119908B2Method and apparatus for measuring thickness of thin film and device manufacturing method using sameHITACHI LTD·Filed 2002·Granted Oct 10, 2006·62 cites·11 claims
- 0393US7969567B2Method and device for detecting shape of surface of mediumHITACHI HIGH TECH CORP·Filed 2009·Granted Jun 28, 2011·18 cites·13 claims
- 0492US6753972B1Thin film thickness measuring method and apparatus, and method and apparatus for manufacturing a thin film device using the sameHITACHI LTD·Filed 1999·Granted Jun 22, 2004·87 cites·22 claims
- 0589US7020306B2Polishing pad surface condition evaluation method and an apparatus thereof and a method of producing a semiconductor deviceHITACHI LTD·Filed 2001·Granted Mar 28, 2006·35 cites·11 claims
- 0670US6897079B2Method of detecting and measuring endpoint of polishing processing and its apparatus and method of manufacturing semiconductor device using the sameHITACHI LTD·Filed 2001·Granted May 24, 2005·11 cites·12 claims
- 0769US8411928B2Scatterometry method and device for inspecting patterned mediumSASAZAWA HIDEAKI·Filed 2009·Granted Apr 2, 2013·2 cites·11 claims
- 0869US8040772B2Method and apparatus for inspecting a pattern shapeHITACHI HIGH TECH CORP·Filed 2009·Granted Oct 18, 2011·1 cites·17 claims
- 0969US7057744B2Method and apparatus for measuring thickness of thin film and device manufacturing method using sameHITACHI LTD·Filed 2002·Granted Jun 6, 2006·13 cites·24 claims
- 1068US8148705B2Method and apparatus for inspecting defects of patterns formed on a hard disk mediumHIROSE TAKENORI·Filed 2008·Granted Apr 3, 2012·2 cites·18 claims
- 1168US6806970B2Thin film thickness measuring method and apparatus, and method and apparatus for manufacturing a thin film device using the sameHITACHI LTD·Filed 2003·Granted Oct 19, 2004·12 cites·10 claims
- 1266US12292330B2Spectrometry apparatusHITACHI HIGH TECH CORP·Filed 2023·Granted May 6, 2025·0 cites·12 claims
- 1366US8638430B2Method for defect determination in fine concave-convex pattern and method for defect determination on patterned mediumSASAZAWA HIDEAKI·Filed 2010·Granted Jan 28, 2014·2 cites·12 claims
- 1463US6987874B2Method and apparatus for managing surface image of thin film device, and method and apparatus for manufacturing thin film device using the sameHITACHI LTD·Filed 2002·Granted Jan 17, 2006·10 cites·19 claims
- 1562US12436097B2Spectroscopic measurement deviceHITACHI HIGH TECH CORP·Filed 2021·Granted Oct 7, 2025·0 cites·11 claims
- 1660US8713710B2Cantilever of scanning probe microscope and method for manufacturing the same, method for inspecting thermal assist type magnetic head device and its apparatusHITACHI HIGH TECH CORP·Filed 2012·Granted Apr 29, 2014·1 cites·14 claims
- 1760US8483035B2Thermally assisted magnetic recording head inspection method and apparatusZHANG KAIFENG·Filed 2012·Granted Jul 9, 2013·1 cites·11 claims
- 1859US2025138047A1Scanning probe microscope and sample used thereinHITACHI HIGH TECH CORP·Filed 2022·Application pending·0 cites
- 1957US8260029B2Pattern shape inspection method and apparatus thereofSAITO KEIYA·Filed 2009·Granted Sep 4, 2012·4 cites·14 claims
- 2057US8259414B2Magnetic recording disk having aligning pattern and method for aligning thereofHIROSE TAKENORI·Filed 2008·Granted Sep 4, 2012·0 cites·13 claims
- 2156US8787134B2Thermally assisted magnetic recording head inspection method and apparatusHITACHI HIGH TECH CORP·Filed 2013·Granted Jul 22, 2014·0 cites·10 claims
- 2256US6794206B2Method of polishing a filmHITACHI LTD·Filed 2002·Granted Sep 21, 2004·5 cites·9 claims
- 2355US7243441B2Method and apparatus for measuring depth of holes formed on a specimenHITACHI KENKI FINE TECH CO LTD·Filed 2004·Granted Jul 17, 2007·8 cites·4 claims
- 2452US11733264B2Cantilever, scanning probe microscope, and measurement method using scanning probe microscopeHITACHI HIGH TECH CORP·Filed 2020·Granted Aug 22, 2023·0 cites·19 claims
- 2552US8279431B2Spectral detection method and device, and defect inspection method and apparatus using the sameHIROSE TAKENORI·Filed 2009·Granted Oct 2, 2012·1 cites·12 claims
- 2645US10393509B2Pattern height measurement device and charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2014·Granted Aug 27, 2019·0 cites·13 claims
- 2745US2014096293A1Method and apparatus for inspecting thermal assist type magnetic headHITACHI HIGH TECH CORP·Filed 2013·Application pending·0 cites
- 2843US8621659B2Cantilever for magnetic force microscope and method of manufacturing the sameZHANG KAIFENG·Filed 2012·Granted Dec 31, 2013·0 cites·11 claims
- 2943US2014092717A1Method and apparatus for inspecting thermal assist type magnetic headHITACHI HIGH TECH CORP·Filed 2013·Application pending·0 cites
- 3036US2002163649A1Film thickness measuring method and apparatus, and thin film device manufacturing method and manufacturing apparatus using sameHITACHI LTD·Filed 2002·Application pending·0 cites
- 3135US2012287426A1Pattern inspection method and device for sameSASAZAWA HIDEAKI·Filed 2011·Application pending·0 cites
- 3232US2012054924A1SPM Probe and Inspection Device for Light Emission UnitZHANG KAIFENG·Filed 2011·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →