Inventor · disambiguated record
Takuya Hoshii
Also filed as: HOSHII TAKUYA
2 granted patents·0 citations·filing 2018–2018
23Inventor score
Files withSUMITOMO CHEMICAL CO2
Top patents by PatentIndex Score
2 records- 0145US11513149B2Method for evaluating electrical defect density of semiconductor layer, and semiconductor elementSUMITOMO CHEMICAL CO·Filed 2018·Granted Nov 29, 2022·0 cites·3 claims
- 0241US11652150B2Charge trap evaluation method and semiconductor elementSUMITOMO CHEMICAL CO·Filed 2018·Granted May 16, 2023·0 cites·16 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →