Inventor · disambiguated record
Taisuke Ichikawa
Also filed as: ICHIKAWA TAISUKE
0 granted patents·2 pending applications·0 citations·filing 2023–2024
Files withKIOXIA CORP2
Top patents by PatentIndex Score
2 records- 0158US2024192269A1Test substrate, test apparatus, and test method for semiconductor integrated circuitKIOXIA CORP·Filed 2023·Application pending·0 cites
- 0257US2025086154A1Semiconductor product evaluation data management system, semiconductor product evaluation data management method, and non-transitory computer-readable storage medium storing a semiconductor product evaluation data management programKIOXIA CORP·Filed 2024·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →