Inventor · disambiguated record
Takuya Ido
Also filed as: IDO TAKUYA
9 granted patents·6 pending applications·26 citations·filing 2009–2022
83Inventor score
Top patents by PatentIndex Score
15 records- 0183US9835556B2Gas analysis deviceHORIBA LTD·Filed 2016·Granted Dec 5, 2017·2 cites·6 claims
- 0282US8934101B2Gas analysis apparatusIDO TAKUYA·Filed 2012·Granted Jan 13, 2015·7 cites·18 claims
- 0382US8896835B2Gas measurement apparatus and the setting method of width of wavelength modulation in gas measurement apparatusHORIBA LTD·Filed 2012·Granted Nov 25, 2014·7 cites·20 claims
- 0474US9234905B2Method of calibrating and calibration apparatus for a moisture concentration measurement apparatusHORIBA LTD·Filed 2012·Granted Jan 12, 2016·2 cites·9 claims
- 0572US9506807B2Optical gas temperature sensorHORIBA LTD·Filed 2014·Granted Nov 29, 2016·3 cites·6 claims
- 0672US8302459B2Thermal conductivity sensorMATSUHAMA MAKOTO·Filed 2010·Granted Nov 6, 2012·4 cites·2 claims
- 0761US8649013B2Probe for gas analysisHOKAMURA SHIGEYUKI·Filed 2011·Granted Feb 11, 2014·1 cites·9 claims
- 0854US2025012712A1Analysis device and analysis methodHORIBA LTD·Filed 2022·Application pending·0 cites
- 0953US2025389643A1Analysis device and analysis methodHORIBA LTD·Filed 2022·Application pending·0 cites
- 1049US2025389654A1Analysis device, program for analysis device, and analysis methodHORIBA LTD·Filed 2022·Application pending·0 cites
- 1141US9116116B2Optical analyzer and wavelength stabilized laser device for analyzerUKON JUICHIRO·Filed 2009·Granted Aug 25, 2015·0 cites·7 claims
- 1238US2014183380A1Measuring unit and gas analyzing apparatusUKON JUICHIRO·Filed 2012·Application pending·0 cites
- 1337US8531669B2Air-driven shutter device and optical analyzerHOKAMURA SHIGEYUKI·Filed 2011·Granted Sep 10, 2013·0 cites·11 claims
- 1437US2017115219A1Gas analyzing apparatusHORIBA LTD·Filed 2016·Application pending·0 cites
- 1537US2017205336A1Analyzing apparatus and analyzing methodHORIBA LTD·Filed 2017·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →