Inventor · disambiguated record
Takashi Iizumi
Also filed as: IIZUMI TAKASHI
35 granted patents·10 pending applications·361 citations·filing 1989–2025
97Inventor score
Top patents by PatentIndex Score
45 records- 0194US10487210B2Coloring composition for textile printing, textile printing method, ink for ink jet textile printing, and dyed fabricFUJIFILM CORP·Filed 2017·Granted Nov 26, 2019·6 cites·11 claims
- 0292US6627888B2Scanning electron microscopeHITACHI LTD·Filed 2001·Granted Sep 30, 2003·30 cites·9 claims
- 0391US11692050B2Photo-alignment copolymer, binder composition, binder layer, optical laminate, and image display deviceFUJIFILM CORP·Filed 2021·Granted Jul 4, 2023·2 cites·17 claims
- 0491US6909930B2Method and system for monitoring a semiconductor device manufacturing processHITACHI LTD·Filed 2002·Granted Jun 21, 2005·52 cites·37 claims
- 0590US7369703B2Method and apparatus for circuit pattern inspectionHITACHI LTD·Filed 2006·Granted May 6, 2008·10 cites·22 claims
- 0690US4907287AImage correction system for scanning electron microscopeHITACHI LTD·Filed 1989·Granted Mar 6, 1990·55 cites·7 claims
- 0788US6708072B2Remote maintenance method, industrial device, and semiconductor deviceHITACHI LTD·Filed 2002·Granted Mar 16, 2004·32 cites·22 claims
- 0887US7551976B2Industrial device receiving remote maintenance operation and outputting charge informationHITACHI LTD·Filed 2007·Granted Jun 23, 2009·12 cites·2 claims
- 0986US7340111B2Image evaluation method and microscopeHITACHI LTD·Filed 2005·Granted Mar 4, 2008·6 cites·5 claims
- 1086US7095884B2Method and apparatus for circuit pattern inspectionHITACHI LTD·Filed 2002·Granted Aug 22, 2006·22 cites·6 claims
- 1186US7034296B2Method of forming a sample image and charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2001·Granted Apr 25, 2006·24 cites·17 claims
- 1285US7236651B2Image evaluation method and microscopeHITACHI LTD·Filed 2002·Granted Jun 26, 2007·16 cites·20 claims
- 1382US11319393B2Photo-alignable polymer, binder composition, binder layer, optical laminate, method for producing optical laminate, and image display deviceFUJIFILM CORP·Filed 2019·Granted May 3, 2022·2 cites·14 claims
- 1482US7910886B2Sample dimension measuring method and scanning electron microscopeHITACHI HIGH TECH CORP·Filed 2007·Granted Mar 22, 2011·6 cites·7 claims
- 1581US7373501B2System and method for on-line diagnosticsHITACHI HIGH TECH CORP·Filed 2003·Granted May 13, 2008·18 cites·3 claims
- 1678US7805023B2Image evaluation method and microscopeHITACHI LTD·Filed 2007·Granted Sep 28, 2010·3 cites·20 claims
- 1778US7800059B2Method of forming a sample image and charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2008·Granted Sep 21, 2010·3 cites·6 claims
- 1877US7439505B2Scanning electron microscopeHITACHI LTD·Filed 2005·Granted Oct 21, 2008·2 cites·7 claims
- 1976US6792325B2Remote maintenance method, industrial device, and semiconductor deviceHITACHI LTD·Filed 2002·Granted Sep 14, 2004·6 cites·9 claims
- 2074US6954677B2Remote maintenance method for industrial device that generates maintenance charge information using received charge listHITACHI LTD·Filed 2004·Granted Oct 11, 2005·4 cites·4 claims
- 2173US7361894B2Method of forming a sample image and charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2006·Granted Apr 22, 2008·6 cites·10 claims
- 2270US7849304B2System and method for on-line diagnosticsHITACHI HIGH TECH CORP·Filed 2007·Granted Dec 7, 2010·1 cites·66 claims
- 2370US7372047B2Charged particle system and a method for measuring image magnificationHITACHI HIGH TECH CORP·Filed 2005·Granted May 13, 2008·2 cites·19 claims
- 2470US2025346813A1Photo-alignment film, optical film, circularly polarizing plate, image display apparatus, and method for manufacturing circularly polarizing plateFUJIFILM CORP·Filed 2025·Application pending·0 cites
- 2569US2025361339A1Photo-alignment polymer, binder composition, binder layer, optical laminate, optical laminate manufacturing method, and image display deviceFUJIFILM CORP·Filed 2025·Application pending·0 cites
- 2668US7285777B2Sample dimension measuring method and scanning electron microscopeHITACHI HIGH TECH CORP·Filed 2003·Granted Oct 23, 2007·13 cites·13 claims
- 2767US11827727B2Photo-alignment polymer, binder composition, binder layer, optical laminate, optical laminate manufacturing method, and image display deviceFUJIFILM CORP·Filed 2022·Granted Nov 28, 2023·0 cites·13 claims
- 2865US7047096B2Remote maintenance method, industrial device, and semiconductor deviceHITACHI LTD·Filed 2004·Granted May 16, 2006·6 cites·4 claims
- 2964US6862485B2Remote maintenance method, industrial device, and semiconductor deviceHITACHI LTD·Filed 2002·Granted Mar 1, 2005·6 cites·8 claims
- 3063US7164126B2Method of forming a sample image and charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2003·Granted Jan 16, 2007·5 cites·1 claims
- 3163US6803573B2Scanning electron microscopeHITACHI LTD·Filed 2003·Granted Oct 12, 2004·6 cites·6 claims
- 3263US2022179250A1Photo-alignment polymer, binder composition, binder layer, optical laminate, optical laminate manufacturing method, and image display deviceFUJIFILM CORP·Filed 2022·Application pending·0 cites
- 3362US2008133032A1System and method for on-line diagnosticsARIMA JUNTARO·Filed 2007·Application pending·0 cites
- 3458US8666165B2Scanning electron microscopeYAMAGUCHI SATORU·Filed 2008·Granted Mar 4, 2014·1 cites·6 claims
- 3554US2023088847A1Optical laminate, polarizing plate, and image display deviceFUJIFILM CORP·Filed 2022·Application pending·0 cites
- 3652US7002151B2Scanning electron microscopeHITACHI LTD·Filed 2004·Granted Feb 21, 2006·2 cites·12 claims
- 3751US7177715B2Remote maintenance method for generating maintenance charge information, industrial device, and semiconductor deviceHITACHI LTD·Filed 2004·Granted Feb 13, 2007·0 cites·4 claims
- 3851US2020004087A1Photo-alignment copolymer, photo-alignment film, and optical laminateFUJIFILM CORP·Filed 2019·Application pending·0 cites
- 3949US2023138456A1Binder composition, compound, binder layer, optical laminate, optical laminate manufacturing method, and image display deviceFUJIFILM CORP·Filed 2022·Application pending·0 cites
- 4049US2014084578A1Azo compound, aqueous solution, ink composition, ink for inkjet recording, inkjet recording method, ink cartridge for inkjet recording, and inkjet recorded materialFUJIFILM CORP·Filed 2013·Application pending·0 cites
- 4146US10662332B2Compound, coloring composition for dyeing or textile printing, ink for ink jet textile printing, method of printing on fabric, and dyed or printed fabricFUJIFILM CORP·Filed 2018·Granted May 26, 2020·0 cites·10 claims
- 4246US2018208772A1Novel compound, coloring composition for dyeing or textile printing, ink for ink jet textile printing, method of printing on fabric, and dyed or printed fabricFUJIFILM CORP·Filed 2018·Application pending·0 cites
- 4345US11914248B2Photo-alignment copolymer, photo-alignment film, and optical laminateFUJIFILM CORP·Filed 2020·Granted Feb 27, 2024·0 cites·15 claims
- 4445US7433542B2Method for measuring line and space pattern using scanning electron microscopeHITACHI HIGH TECH CORP·Filed 2004·Granted Oct 7, 2008·2 cites·11 claims
- 4545US2017101533A1Novel compound, coloring composition for dyeing or textile printing, ink jet ink, method of printing on fabric, and dyed or printed fabricFUJIFILM CORP·Filed 2016·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when Takashi Iizumi files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →