Inventor · disambiguated record
Takefumi Inagaki
Also filed as: INAGAKI TAKEFUMI
20 granted patents·1 pending application·926 citations·filing 1974–2004
97Inventor score
Top patents by PatentIndex Score
21 records- 0195US4559452AApparatus for detecting edge of semitransparent plane substanceFUJITSU LTD·Filed 1983·Granted Dec 17, 1985·121 cites·10 claims
- 0292US4728186AUneven-surface data detection apparatusFUJITSU LTD·Filed 1986·Granted Mar 1, 1988·142 cites·33 claims
- 0391US4832464AOptical system with grating lens assembly for correcting wavelength aberrationsFUJITSU LTD·Filed 1987·Granted May 23, 1989·46 cites·45 claims
- 0491US4651341APattern recognition apparatus and a pattern recognition methodFUJITSU LTD·Filed 1983·Granted Mar 17, 1987·83 cites·15 claims
- 0591US4647143ALight-beam scanning apparatusFUJITSU LTD·Filed 1984·Granted Mar 3, 1987·101 cites·20 claims
- 0687US4637027ALaser light source deviceFUJITSU LTD·Filed 1984·Granted Jan 13, 1987·32 cites·10 claims
- 0785US4177379ABack-scattered electron detector for use in an electron microscope or electron beam exposure system to detect back-scattered electronsFUJITSU LTD·Filed 1978·Granted Dec 4, 1979·22 cites·12 claims
- 0883US4957336ALaser beam scanner and its fabricating methodFUJITSU LTD·Filed 1988·Granted Sep 18, 1990·51 cites·29 claims
- 0983US4165464ALight scanning systemFUJITSU LTD·Filed 1976·Granted Aug 21, 1979·39 cites·27 claims
- 1081US4450579ARecognition method and apparatusFUJITSU LTD·Filed 1981·Granted May 22, 1984·49 cites·23 claims
- 1179US4848862ALaser beam scannerFUJITSU LTD·Filed 1987·Granted Jul 18, 1989·44 cites·16 claims
- 1279US4810046ALight beam scanning apparatusFUJITSU LTD·Filed 1987·Granted Mar 7, 1989·40 cites·12 claims
- 1374US4824191AOptical pickupFUJITSU LTD·Filed 1988·Granted Apr 25, 1989·19 cites·11 claims
- 1473US4639070ABeam scanning type information readout deviceFUJITSU LTD·Filed 1981·Granted Jan 27, 1987·34 cites·3 claims
- 1568US6084610AInk jet recording method and apparatus, ink and ink cartridgeFUJITSU LTD·Filed 1996·Granted Jul 4, 2000·28 cites·38 claims
- 1666US3964830AMethod for inspecting flaws of materialFUJITSU LTD·Filed 1974·Granted Jun 22, 1976·17 cites·9 claims
- 1763US4904033AMethod for constructing hologramsFUJITSU LTD·Filed 1988·Granted Feb 27, 1990·21 cites·14 claims
- 1858US4655541AHologram scannerFUJITSU LTD·Filed 1984·Granted Apr 7, 1987·14 cites·24 claims
- 1949US4968108AMethod for constructing and reconstructing hologramFUJITSU LTD·Filed 1989·Granted Nov 6, 1990·13 cites·9 claims
- 2045US4938550AHolographic deflection deviceFUJITSU LTD·Filed 1988·Granted Jul 3, 1990·10 cites·37 claims
- 2136US2004199371A1Method of configuring simulation program for computing amounts of heat exchanged and storage medium containing the simulation programFUJITSU GENERAL LTD·Filed 2004·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →