Inventor · disambiguated record
Takashi Ishimoto
Also filed as: ISHIMOTO TAKASHI
6 granted patents·1 pending application·62 citations·filing 1988–2016
81Inventor score
Top patents by PatentIndex Score
7 records- 0170US5002009AFurnace for formation of black oxide film on the surface of thin metal sheet and method for formation of black oxide film on the surface of shadow mask material by use of said furnaceTOSHIBA KK·Filed 1989·Granted Mar 26, 1991·19 cites·5 claims
- 0264US5568056AWafer proberTOKYO SEIMITSU CO LTD·Filed 1994·Granted Oct 22, 1996·26 cites·4 claims
- 0362US9869715B2Semiconductor wafer inspection apparatus and semiconductor wafer inspection methodTOKYO SEIMITSU CO LTD·Filed 2016·Granted Jan 16, 2018·1 cites·10 claims
- 0449US2010068669A1Continuous heat treatment furnaceDAIDO STEEL CO LTD·Filed 2009·Application pending·0 cites
- 0537US6366102B1Wafer probing machineTOKYO SEIMITSU CO LTD·Filed 1998·Granted Apr 2, 2002·8 cites·7 claims
- 0637US4859251AFurnace for formation of black oxide film on the surface of thin metal sheet and method for formation of black oxide film on the surface of shadow mask material by use of said furnaceTOSHIBA KK·Filed 1988·Granted Aug 22, 1989·8 cites·3 claims
- 0735US7129507B2Chip mis-position detection methodTOKYO SEIMITSU CO LTD·Filed 2005·Granted Oct 31, 2006·0 cites·4 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →