Inventor · disambiguated record
Tami Isobe
Also filed as: ISOBE TAMI
13 granted patents·507 citations·filing 1988–2007
94Inventor score
Top patents by PatentIndex Score
13 records- 0195US4932743AOptical waveguide deviceRICOH KK·Filed 1989·Granted Jun 12, 1990·123 cites·15 claims
- 0289US5208800AMode splitter and magneto-optical signal detection deviceRICOH KK·Filed 1991·Granted May 4, 1993·104 cites·11 claims
- 0388US4877301ACovered optical waveguide having an inlet openingRICOH KK·Filed 1988·Granted Oct 31, 1989·37 cites·29 claims
- 0484US5420680AMethod for measuring refractive index and thickness of film and apparatus thereforRICOH KK·Filed 1993·Granted May 30, 1995·54 cites·14 claims
- 0583US5235589AApparatus for recording and reproducing optical information and prism couplerRICOH KK·Filed 1991·Granted Aug 10, 1993·67 cites·1 claims
- 0680US8120804B2Image processing system, image managing device, method, storage medium and image processing deviceISOBE TAMI·Filed 2007·Granted Feb 21, 2012·13 cites·19 claims
- 0774US5034617AMethod and apparatus for measuring refractive index and thickness of filmRICOH KK·Filed 1988·Granted Jul 23, 1991·30 cites·8 claims
- 0864US5119452AHigh efficiency prism coupling device and method for producing the sameRICOH KK·Filed 1990·Granted Jun 2, 1992·28 cites·7 claims
- 0962US5096298AMethod for measuring refractive index of thin film layerRICOH KK·Filed 1989·Granted Mar 17, 1992·19 cites·2 claims
- 1045US4983823AMethod for determining incident angle in measurement of refractive index and thicknessRICOH KK·Filed 1990·Granted Jan 8, 1991·12 cites·14 claims
- 1144US5107105AMethod for measuring an unknown parameter of a thin film and apparatus thereforRICOH KK·Filed 1990·Granted Apr 21, 1992·12 cites·6 claims
- 1242US5471440AMagnetooptic apparatus with integrated detecting element providing signal with high S/N ratioRICOH KK·Filed 1993·Granted Nov 28, 1995·5 cites·4 claims
- 1332US5073026AMethod for measuring refractive index of thin film layerRICOH KK·Filed 1988·Granted Dec 17, 1991·3 cites·9 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →