Inventor · disambiguated record
Takushi Itagaki
Also filed as: ITAGAKI TAKUSHI
11 granted patents·1 pending application·400 citations·filing 1986–2007
93Inventor score
Top patents by PatentIndex Score
12 records- 0195US5084107ASolar cell and solar cell array with adhered electrodeMITSUBISHI ELECTRIC CORP·Filed 1990·Granted Jan 28, 1992·150 cites·18 claims
- 0284US5602863ASurface-emitting laser diode array and driving method thereof, photodetector, photodetector array, optical interconnection system, and multiwavelength optical communication systemMITSUBISHI ELECTRIC CORP·Filed 1994·Granted Feb 11, 1997·48 cites·21 claims
- 0378US5151373AMethod of making a solar cell electrodeMITSUBISHI ELECTRIC CORP·Filed 1991·Granted Sep 29, 1992·45 cites·4 claims
- 0466US5436195AMethod of fabricating an integrated semiconductor light modulator and laserMITSUBISHI ELECTRIC CORP·Filed 1994·Granted Jul 25, 1995·30 cites·12 claims
- 0562US5912475AOptical semiconductor device with InPMITSUBISHI ELECTRIC CORP·Filed 1996·Granted Jun 15, 1999·24 cites·3 claims
- 0662US5728215AMethod for forming a film by selective area MOCVD growthMITSUBISHI ELECTRIC CORP·Filed 1995·Granted Mar 17, 1998·23 cites·27 claims
- 0760US5328520ASolar cell with low resistance linear electrodeMITSUBISHI ELECTRIC CORP·Filed 1992·Granted Jul 12, 1994·23 cites·6 claims
- 0852US5498289AApparatus for applying narrow metal electrodeMITSUBISHI ELECTRIC CORP·Filed 1994·Granted Mar 12, 1996·17 cites·4 claims
- 0952US5389573AMethod of making narrow metal electrodeMITSUBISHI ELECTRIC CORP·Filed 1994·Granted Feb 14, 1995·17 cites·5 claims
- 1051US5763287AMethod of fabricating semiconductor optical deviceMITSUBISHI ELECTRIC CORP·Filed 1996·Granted Jun 9, 1998·16 cites·12 claims
- 1145US2007298610A1Method for producing electro-optical apparatusSEIKO EPSON CORP·Filed 2007·Application pending·0 cites
- 1235US4701572AAmorphous solar cellMITSUBISHI ELECTRIC CORP·Filed 1986·Granted Oct 20, 1987·7 cites·8 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →