Inventor · disambiguated record
Tae-Seong Jang
Also filed as: JANG TAE-SEONG
19 granted patents·2 pending applications·283 citations·filing 1994–2015
95Inventor score
Top patents by PatentIndex Score
21 records- 0191US9588840B2Memory devices that perform masked write operations and methods of operating the sameCHUNG HOI-JU·Filed 2014·Granted Mar 7, 2017·19 cites·30 claims
- 0284US9164834B2Semiconductor memory devices, memory systems including the same and method of writing data in the sameCHUNG HOI-JU·Filed 2014·Granted Oct 20, 2015·8 cites·34 claims
- 0379US6514293B1Prosthetic footKOREA ADVANCED INST SCI & TECH·Filed 2000·Granted Feb 4, 2003·89 cites·13 claims
- 0474US9036439B2Semiconductor memory device having improved refresh characteristicsKIM JUNG-SIK·Filed 2012·Granted May 19, 2015·5 cites·20 claims
- 0571US10318469B2Semiconductor memory device, memory system, and method using bus-invert encodingSAMSUNG ELECTRONICS CO LTD·Filed 2015·Granted Jun 11, 2019·2 cites·17 claims
- 0670US6590434B2Delay time controlling circuit and method for controlling delay timeSAMSUNG ELECTRONICS CO LTD·Filed 2002·Granted Jul 8, 2003·17 cites·31 claims
- 0769US6329863B1Input circuit having a fuse therein and semiconductor device having the sameSAMSUNG ELECTRONICS CO LTD·Filed 2000·Granted Dec 11, 2001·17 cites·8 claims
- 0867US5959936AColumn select line enable circuit for a semiconductor memory deviceSAMSUNG ELECTRONICS CO LTD·Filed 1997·Granted Sep 28, 1999·26 cites·11 claims
- 0966US6031786AOperation control circuits and methods for integrated circuit memory devicesSAMSUNG ELECTRONICS CO LTD·Filed 1998·Granted Feb 29, 2000·24 cites·25 claims
- 1065US6392909B1Semiconductor memory device having fixed CAS latency in normal operation and various CAS latencies in test modeSAMSUNG ELECTRONICS CO LTD·Filed 2001·Granted May 21, 2002·17 cites·19 claims
- 1155US7315483B2Circuit for selecting a power supply voltage and semiconductor device having the sameSAMSUNG ELECTRONICS CO LTD·Filed 2006·Granted Jan 1, 2008·3 cites·16 claims
- 1249US5946269ASynchronous RAM controlling device and methodSAMSUNG ELECTRONICS CO LTD·Filed 1998·Granted Aug 31, 1999·12 cites·7 claims
- 1349US5677881ASemiconductor memory device having a shortened test time and contol method thereforSAMSUNG ELECTRONICS CO LTD·Filed 1995·Granted Oct 14, 1997·12 cites·4 claims
- 1447US2014317471A1Semiconductor memory devices including separately disposed error-correcting code (ecc) circuitsSAMSUNG ELECTRONICS CO LTD·Filed 2014·Application pending·0 cites
- 1545US5677877AIntegrated circuit chips with multiplexed input/output pads and methods of operating sameSAMSUNG ELECTRONICS CO LTD·Filed 1996·Granted Oct 14, 1997·10 cites·29 claims
- 1643US5684748ACircuit for testing reliability of chip and semiconductor memory device having the circuitSAMSUNG ELECTRONICS CO LTD·Filed 1994·Granted Nov 4, 1997·9 cites·15 claims
- 1742US5579268ASemiconductor memory device capable of driving word lines at high speedSAMSUNG ELECTRONICS CO LTD·Filed 1995·Granted Nov 26, 1996·7 cites·1 claims
- 1840US6950365B2Semiconductor memory device having bitline coupling scheme capable of preventing deterioration of sensing speedSAMSUNG ELECTRONICS CO LTD·Filed 2003·Granted Sep 27, 2005·2 cites·9 claims
- 1939US6301170B2MRAD test circuit, semiconductor memory device having the same and MRAD test methodSAMSUNG ELECTRONICS CO LTD·Filed 2001·Granted Oct 9, 2001·2 cites·7 claims
- 2038US2014331006A1Semiconductor memory devicesSAMSUNG ELECTRONICS CO LTD·Filed 2014·Application pending·0 cites
- 2132US5550776ASemiconductor memory device capable of driving word lines at high speedSAMSUNG ELECTRONICS CO LTD·Filed 1994·Granted Aug 27, 1996·2 cites·5 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →