Inventor · disambiguated record
Tae Ho Jeon
Also filed as: JEON TAE HO
8 granted patents·4 pending applications·12 citations·filing 2009–2019
77Inventor score
Files withSAMSUNG ELECTRONICS CO LTD3JEON TAE HO2SAMSUNG MEDISON CO LTD2WONIK IPS CO LTD2PARK WON SUN1
Top patents by PatentIndex Score
12 records- 0171US8902674B2Semiconductor memory device and method of reading out the sameYANG IN GON·Filed 2012·Granted Dec 2, 2014·6 cites·15 claims
- 0271US8867283B2Semiconductor memory device, operating method thereof, and data storage apparatus including the samePARK WON SUN·Filed 2012·Granted Oct 21, 2014·5 cites·20 claims
- 0351US11024796B2Method of manufacturing an ultrasonic probeSAMSUNG MEDISON CO LTD·Filed 2018·Granted Jun 1, 2021·0 cites·11 claims
- 0448US10699900B2Method for forming thin filmWONIK IPS CO LTD·Filed 2019·Granted Jun 30, 2020·0 cites·20 claims
- 0546US10662528B2Substrate processing apparatus and substrate processing method using the sameWONIK IPS CO LTD·Filed 2017·Granted May 26, 2020·0 cites·11 claims
- 0646US2017311928A1Ultrasonic imaging apparatus and method of controlling the sameSAMSUNG ELECTRONICS CO LTD·Filed 2014·Application pending·0 cites
- 0745US10031172B2Method and apparatus for determining occurrence of electrical fault in channel of ultrasound probeSAMSUNG MEDISON CO LTD·Filed 2016·Granted Jul 24, 2018·0 cites·16 claims
- 0845US8898377B2Semiconductor device and method of generating random dataJEON TAE HO·Filed 2012·Granted Nov 25, 2014·1 cites·16 claims
- 0944US11382605B2Ultrasound probe, ultrasound imaging apparatus and method of controlling the ultrasound imaging apparatusSAMSUNG ELECTRONICS CO LTD·Filed 2018·Granted Jul 12, 2022·0 cites·13 claims
- 1044US2011184497A1Ac logic powered stimulator ic for neural prosthesisSNU R&DB FOUNDATION·Filed 2009·Application pending·0 cites
- 1143US2018271492A1Ultrasonic apparatus and beamforming method for the sameSAMSUNG ELECTRONICS CO LTD·Filed 2014·Application pending·0 cites
- 1223US2013326295A1Semiconductor memory device including self-contained test unit and test method thereofJEON TAE HO·Filed 2012·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →