Inventor · disambiguated record
Tatsuya Kajita
Also filed as: KAJITA TATSUYA · YAMASHITA MINORU
21 granted patents·5 pending applications·344 citations·filing 1992–2008
96Inventor score
Top patents by PatentIndex Score
26 records- 0196US7253046B2Semiconductor memory device and manufacturing method thereofSPANSION LLC·Filed 2005·Granted Aug 7, 2007·45 cites·17 claims
- 0295US7410857B2Semiconductor memory device and manufacturing method thereofSPANSION LLC·Filed 2007·Granted Aug 12, 2008·30 cites·11 claims
- 0387US7098147B2Semiconductor memory device and method for manufacturing semiconductor deviceFUJITSU AMD SEMICONDUCTOR LTD·Filed 2003·Granted Aug 29, 2006·39 cites·12 claims
- 0479US5907781AProcess for fabricating an integrated circuit with a self-aligned contactADVANCED MICRO DEVICES INC·Filed 1998·Granted May 25, 1999·59 cites·20 claims
- 0572US5910916AFlash-erasable semiconductor memory device having improved reliabilityFUJITSU LTD·Filed 1997·Granted Jun 8, 1999·21 cites·7 claims
- 0670US5449629AMethod for fabricating a semiconductor memory device having a floating gate with improved insulation film qualityFUJITSU LTD·Filed 1992·Granted Sep 12, 1995·27 cites·3 claims
- 0765US6444539B1Method for producing a shallow trench isolation filled with thermal oxideADVANCED MICRO DEVICES INC·Filed 2001·Granted Sep 3, 2002·10 cites·15 claims
- 0864US5497018ASemiconductor memory device having a floating gate with improved insulation film qualityFUJITSU LTD·Filed 1994·Granted Mar 5, 1996·21 cites·2 claims
- 0962US6014329AFlash-erasable semiconductor memory device having an improved reliabilityFUJITSU LTD·Filed 1997·Granted Jan 11, 2000·14 cites·12 claims
- 1062US5761127AFlash-erasable semiconductor memory device having an improved reliabilityFUJITSU LTD·Filed 1992·Granted Jun 2, 1998·14 cites·7 claims
- 1155US2008265309A1Semiconductor memory device and manufacturing method thereofSPANSION LLC·Filed 2008·Application pending·0 cites
- 1254US5950086AMethod of fabricating an EPROM type device with reduced process residuesFUJITSU LTD·Filed 1997·Granted Sep 7, 1999·13 cites·12 claims
- 1353US6232646B1Shallow trench isolation filled with thermal oxideADVANCED MICRO DEVICES INC·Filed 1998·Granted May 15, 2001·19 cites·2 claims
- 1450US5835408AFlash-erasable semiconductor memory device having an improved reliabilityFUJITSU LTD·Filed 1997·Granted Nov 10, 1998·8 cites·3 claims
- 1548US2006228899A1Semiconductor memory device and method for manufacturing semiconductor deviceFUJITSU AMD SEMICONDUCTOR LTD·Filed 2006·Application pending·0 cites
- 1646US5468664AMethod of making semiconductor device with alignment marksFUJITSU LTD·Filed 1994·Granted Nov 21, 1995·9 cites·15 claims
- 1745US6420224B2Stepper alignment mark formation with dual field oxide processADVANCED MICRO DEVICES INC·Filed 2001·Granted Jul 16, 2002·1 cites·5 claims
- 1838US2004082198A1Method of manufacturing semiconductor deviceFiled 2003·Application pending·0 cites
- 1936US2005212074A1Semiconductor device and method of manufacturing the sameFUJITSU AMD SEMICONDUCTOR LTD·Filed 2003·Application pending·0 cites
- 2036US2005212035A1Semiconductor storage device and manufacturing method thereofFUJITSU AMD SEMICONDUCTOR LTD·Filed 2005·Application pending·0 cites
- 2135US6249036B1Stepper alignment mark formation with dual field oxide processADVANCED MICRO DEVICES INC·Filed 1998·Granted Jun 19, 2001·4 cites·3 claims
- 2235US5870337AFlash-erasable semiconductor memory device having an improved reliabilityFUJITSU LTD·Filed 1997·Granted Feb 9, 1999·2 cites·2 claims
- 2335US5641979ASemiconductor memory device having electrically erasable programmable read only memory and dynamic random access memory functions and method of writing, reading and erasing information thereforFUJITSU LTD·Filed 1994·Granted Jun 24, 1997·4 cites·43 claims
- 2432US5835416AFlash-erasable semiconductor memory device having an improved reliabilityFUJITSU LTD·Filed 1997·Granted Nov 10, 1998·1 cites·3 claims
- 2531US6444530B1Process for fabricating an integrated circuit with a self-aligned contactADVANCED MICRO DEVICES INC·Filed 1999·Granted Sep 3, 2002·2 cites·19 claims
- 2630US5391902ASemiconductor device and production method thereofFUJITSU LTD·Filed 1992·Granted Feb 21, 1995·1 cites·5 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →